{"title":"毫米波高温过程监测","authors":"P. Woskov","doi":"10.1109/ICIMW.2002.1076052","DOIUrl":null,"url":null,"abstract":"Millimeter-wave technologies can provide novel and reliable on-line monitoring capability for many important parameters inside high temperature process environments such as in the manufacture of glass, metals, and waste remediation. Important parameters include temperature, emissivity, density, and viscosity, which often cannot be monitored reliably by conventional techniques. The physical and analytical basis for millimeter-wave monitoring of high temperature processes is presented along with experimental results at temperatures up to 1500/spl deg/C.","PeriodicalId":23431,"journal":{"name":"Twenty Seventh International Conference on Infrared and Millimeter Waves","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2002-12-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Millimeter-wave high temperature process monitoring\",\"authors\":\"P. Woskov\",\"doi\":\"10.1109/ICIMW.2002.1076052\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Millimeter-wave technologies can provide novel and reliable on-line monitoring capability for many important parameters inside high temperature process environments such as in the manufacture of glass, metals, and waste remediation. Important parameters include temperature, emissivity, density, and viscosity, which often cannot be monitored reliably by conventional techniques. The physical and analytical basis for millimeter-wave monitoring of high temperature processes is presented along with experimental results at temperatures up to 1500/spl deg/C.\",\"PeriodicalId\":23431,\"journal\":{\"name\":\"Twenty Seventh International Conference on Infrared and Millimeter Waves\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2002-12-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Twenty Seventh International Conference on Infrared and Millimeter Waves\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICIMW.2002.1076052\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Twenty Seventh International Conference on Infrared and Millimeter Waves","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICIMW.2002.1076052","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Millimeter-wave high temperature process monitoring
Millimeter-wave technologies can provide novel and reliable on-line monitoring capability for many important parameters inside high temperature process environments such as in the manufacture of glass, metals, and waste remediation. Important parameters include temperature, emissivity, density, and viscosity, which often cannot be monitored reliably by conventional techniques. The physical and analytical basis for millimeter-wave monitoring of high temperature processes is presented along with experimental results at temperatures up to 1500/spl deg/C.