{"title":"基于事件的多重故障模型","authors":"P. Dörre","doi":"10.1016/0143-8174(87)90086-2","DOIUrl":null,"url":null,"abstract":"<div><p>A new parametric model for common cause failure quantification in reliability analysis is described. Although formally similar to the Multiple Greek Letter model, its parameters are based on event frequencies, not on component failure frequencies. The model is defined in terms of its inputs from event data evaluation and its outputs which correspond to fault tree basic events.</p></div>","PeriodicalId":101070,"journal":{"name":"Reliability Engineering","volume":"17 1","pages":"Pages 73-80"},"PeriodicalIF":0.0000,"publicationDate":"1987-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0143-8174(87)90086-2","citationCount":"5","resultStr":"{\"title\":\"An event-based multiple malfunction model\",\"authors\":\"P. Dörre\",\"doi\":\"10.1016/0143-8174(87)90086-2\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>A new parametric model for common cause failure quantification in reliability analysis is described. Although formally similar to the Multiple Greek Letter model, its parameters are based on event frequencies, not on component failure frequencies. The model is defined in terms of its inputs from event data evaluation and its outputs which correspond to fault tree basic events.</p></div>\",\"PeriodicalId\":101070,\"journal\":{\"name\":\"Reliability Engineering\",\"volume\":\"17 1\",\"pages\":\"Pages 73-80\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1987-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://sci-hub-pdf.com/10.1016/0143-8174(87)90086-2\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Reliability Engineering\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/0143817487900862\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Reliability Engineering","FirstCategoryId":"1085","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/0143817487900862","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A new parametric model for common cause failure quantification in reliability analysis is described. Although formally similar to the Multiple Greek Letter model, its parameters are based on event frequencies, not on component failure frequencies. The model is defined in terms of its inputs from event data evaluation and its outputs which correspond to fault tree basic events.