采用全数字自校准5ps分辨率时间-数字转换器的高性能处理器现场延迟松弛监视器

D. Fick, Nurrachman Liu, Z. Foo, Matthew R. Fojtik, Jae-sun Seo, D. Sylvester, D. Blaauw
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引用次数: 39

摘要

先进的CMOS技术已经变得非常容易受到工艺,电压和温度(PVT)的变化。解决这个问题的标准方法是以功率和性能为代价来增加时间裕度。回收这些损失的一种方法依赖于金丝雀电路[1]或传感器[2],这很容易实现,但不能解释局部变化。最近的一种方法,称为Razor,使用延迟推测加上错误检测和纠正来消除所有的边距,但也增加了显著的设计复杂性[3]。在本文中,我们提出了一种微创原位延迟松弛监测仪,它直接测量关键定时信号的定时裕度,从而消除全局和局部PVT变化带来的裕度。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
In situ delay-slack monitor for high-performance processors using an all-digital self-calibrating 5ps resolution time-to-digital converter
Advanced CMOS technologies have become highly susceptible to process, voltage, and temperature (PVT) variation. The standard approach for addressing this issue is to increase timing margin at the expense of power and performance. One approach to reclaim these losses relies on canary circuits [1] or sensors [2], which are simple to implement but cannot account for local variations. A more recent approach, called Razor, uses delay speculation coupled with error detection and correction to remove all margins but also imposes significant design complexity [3]. In this paper, we present a minimally-invasive in situ delay slack monitor that directly measures the timing margins on critical timing signals, allowing margins due to both global and local PVT variations to be removed.
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