{"title":"镶嵌结构照明显微镜","authors":"Doron Shterman, O. Eyal, S. Tsesses, G. Bartal","doi":"10.1364/cleo_at.2020.am2i.3","DOIUrl":null,"url":null,"abstract":"Treating structured illumination microscopy (SIM) as a Fourier domain tessellation challenge, we suggest a super-resolution method allowing spatial resolution better than λ/4 and requiring up to three times less raw images, effectively increasing temporal resolution.","PeriodicalId":6719,"journal":{"name":"2020 Conference on Lasers and Electro-Optics (CLEO)","volume":"29 6 1","pages":"1-2"},"PeriodicalIF":0.0000,"publicationDate":"2020-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Tessellation Structured Illumination Microscopy\",\"authors\":\"Doron Shterman, O. Eyal, S. Tsesses, G. Bartal\",\"doi\":\"10.1364/cleo_at.2020.am2i.3\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Treating structured illumination microscopy (SIM) as a Fourier domain tessellation challenge, we suggest a super-resolution method allowing spatial resolution better than λ/4 and requiring up to three times less raw images, effectively increasing temporal resolution.\",\"PeriodicalId\":6719,\"journal\":{\"name\":\"2020 Conference on Lasers and Electro-Optics (CLEO)\",\"volume\":\"29 6 1\",\"pages\":\"1-2\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-05-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 Conference on Lasers and Electro-Optics (CLEO)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1364/cleo_at.2020.am2i.3\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 Conference on Lasers and Electro-Optics (CLEO)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1364/cleo_at.2020.am2i.3","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Treating structured illumination microscopy (SIM) as a Fourier domain tessellation challenge, we suggest a super-resolution method allowing spatial resolution better than λ/4 and requiring up to three times less raw images, effectively increasing temporal resolution.
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