{"title":"层状材料的层错分析","authors":"H Dittrich, M Wohlfahrt-Mehrens","doi":"10.1016/S1466-6049(01)00143-X","DOIUrl":null,"url":null,"abstract":"<div><p>Ordered and disordered stacking sequences in graphite and Li-intercalated graphite were modelled. The X-ray powder patterns were simulated by the diffracted intensities from faulted xtals (DIFFaX) program. Resulting diffraction patterns show characteristic differences for hexagonal, rhombohedral and statistical intermixed stacking orders. For this reason, simulated patterns can be used for quantitative analysis of stacking faults by profile fitting, using the DIFFaX simulation parameters as fit parameters.</p></div>","PeriodicalId":100700,"journal":{"name":"International Journal of Inorganic Materials","volume":"3 8","pages":"Pages 1137-1142"},"PeriodicalIF":0.0000,"publicationDate":"2001-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/S1466-6049(01)00143-X","citationCount":"24","resultStr":"{\"title\":\"Stacking fault analysis in layered materials\",\"authors\":\"H Dittrich, M Wohlfahrt-Mehrens\",\"doi\":\"10.1016/S1466-6049(01)00143-X\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>Ordered and disordered stacking sequences in graphite and Li-intercalated graphite were modelled. The X-ray powder patterns were simulated by the diffracted intensities from faulted xtals (DIFFaX) program. Resulting diffraction patterns show characteristic differences for hexagonal, rhombohedral and statistical intermixed stacking orders. For this reason, simulated patterns can be used for quantitative analysis of stacking faults by profile fitting, using the DIFFaX simulation parameters as fit parameters.</p></div>\",\"PeriodicalId\":100700,\"journal\":{\"name\":\"International Journal of Inorganic Materials\",\"volume\":\"3 8\",\"pages\":\"Pages 1137-1142\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2001-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://sci-hub-pdf.com/10.1016/S1466-6049(01)00143-X\",\"citationCount\":\"24\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Journal of Inorganic Materials\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S146660490100143X\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Journal of Inorganic Materials","FirstCategoryId":"1085","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S146660490100143X","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Ordered and disordered stacking sequences in graphite and Li-intercalated graphite were modelled. The X-ray powder patterns were simulated by the diffracted intensities from faulted xtals (DIFFaX) program. Resulting diffraction patterns show characteristic differences for hexagonal, rhombohedral and statistical intermixed stacking orders. For this reason, simulated patterns can be used for quantitative analysis of stacking faults by profile fitting, using the DIFFaX simulation parameters as fit parameters.
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
