{"title":"痕量气体分析的选择性离子源","authors":"W. Genuit, Chen He-Neng , A.J.H. Boerboom, J. Los","doi":"10.1016/0020-7381(83)85006-2","DOIUrl":null,"url":null,"abstract":"<div><p>An ion source is described in which molecules having an ionization potential less than 11.8 eV are selectively photoionized. It is shown that this method considerably improves the air contaminant detection limit of a standard quadrupole mass spectrometer and has great potential in the analysis of complex mixtures of trace gases.</p></div>","PeriodicalId":13998,"journal":{"name":"International Journal of Mass Spectrometry and Ion Physics","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"1983-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0020-7381(83)85006-2","citationCount":"10","resultStr":"{\"title\":\"Selective ion source for trace gas analysis\",\"authors\":\"W. Genuit, Chen He-Neng , A.J.H. Boerboom, J. Los\",\"doi\":\"10.1016/0020-7381(83)85006-2\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>An ion source is described in which molecules having an ionization potential less than 11.8 eV are selectively photoionized. It is shown that this method considerably improves the air contaminant detection limit of a standard quadrupole mass spectrometer and has great potential in the analysis of complex mixtures of trace gases.</p></div>\",\"PeriodicalId\":13998,\"journal\":{\"name\":\"International Journal of Mass Spectrometry and Ion Physics\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1983-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://sci-hub-pdf.com/10.1016/0020-7381(83)85006-2\",\"citationCount\":\"10\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Journal of Mass Spectrometry and Ion Physics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/0020738183850062\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Journal of Mass Spectrometry and Ion Physics","FirstCategoryId":"1085","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/0020738183850062","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An ion source is described in which molecules having an ionization potential less than 11.8 eV are selectively photoionized. It is shown that this method considerably improves the air contaminant detection limit of a standard quadrupole mass spectrometer and has great potential in the analysis of complex mixtures of trace gases.
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