{"title":"电测量用复杂电极系统的电场分析","authors":"A. Jambula, V. Lakdawala, P. Basappa","doi":"10.1109/CEIDP.2008.4772937","DOIUrl":null,"url":null,"abstract":"For effective use in electrical measurements, such as electroluminescence, capacitance and conduction current the dimensions of the electrode system are optimized and subsequently field values at key points in an axi-symmetric electrode system are simulated as a function of clearances between low voltage and guard electrodes. Since the electrode system is axi-symmetric, electric field distribution around the circular corners has been analyzed with the help of two-dimensional BEM solver. The configurations simulated, results, analyses and configurations for an optimal design are presented. These results are useful in the design of planar junctions with better breakdown characteristics and optimal utilization.","PeriodicalId":6381,"journal":{"name":"2008 Annual Report Conference on Electrical Insulation and Dielectric Phenomena","volume":"228 1","pages":"341-344"},"PeriodicalIF":0.0000,"publicationDate":"2008-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Electric Field Analysis of Complex Electrode System for Use in Electrical Measurements\",\"authors\":\"A. Jambula, V. Lakdawala, P. Basappa\",\"doi\":\"10.1109/CEIDP.2008.4772937\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"For effective use in electrical measurements, such as electroluminescence, capacitance and conduction current the dimensions of the electrode system are optimized and subsequently field values at key points in an axi-symmetric electrode system are simulated as a function of clearances between low voltage and guard electrodes. Since the electrode system is axi-symmetric, electric field distribution around the circular corners has been analyzed with the help of two-dimensional BEM solver. The configurations simulated, results, analyses and configurations for an optimal design are presented. These results are useful in the design of planar junctions with better breakdown characteristics and optimal utilization.\",\"PeriodicalId\":6381,\"journal\":{\"name\":\"2008 Annual Report Conference on Electrical Insulation and Dielectric Phenomena\",\"volume\":\"228 1\",\"pages\":\"341-344\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 Annual Report Conference on Electrical Insulation and Dielectric Phenomena\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CEIDP.2008.4772937\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 Annual Report Conference on Electrical Insulation and Dielectric Phenomena","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CEIDP.2008.4772937","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Electric Field Analysis of Complex Electrode System for Use in Electrical Measurements
For effective use in electrical measurements, such as electroluminescence, capacitance and conduction current the dimensions of the electrode system are optimized and subsequently field values at key points in an axi-symmetric electrode system are simulated as a function of clearances between low voltage and guard electrodes. Since the electrode system is axi-symmetric, electric field distribution around the circular corners has been analyzed with the help of two-dimensional BEM solver. The configurations simulated, results, analyses and configurations for an optimal design are presented. These results are useful in the design of planar junctions with better breakdown characteristics and optimal utilization.