{"title":"基于非线性偏微分方程的异质结构零电阻输出放大器","authors":"E. Pankratov","doi":"10.11591/ijaas.v11.i2.pp126-145","DOIUrl":null,"url":null,"abstract":"In this paper, we introduce an approach to increase the density of field-effect transistors framework nulling-resistor output amplifier. In the framework of the approach, we consider manufacturing the amplifier in a heterostructure with a specific configuration. Several required areas of the heterostructure should be doped by diffusion or ion implantation. After that dopant and radiation defects should be annealed framework optimized scheme. We also consider an approach to decrease the value of mismatch-induced stress in the considered heterostructure. We introduce an analytical approach to analyze mass and heat transport in heterostructures during the manufacturing of integrated circuits with account for mismatch-induced stress. ","PeriodicalId":44367,"journal":{"name":"International Journal of Advances in Engineering Sciences and Applied Mathematics","volume":"15 4 1","pages":""},"PeriodicalIF":1.2000,"publicationDate":"2022-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A nulling-resistor output amplifier in the framework of heterostructures based on nonlinear partial differential equations\",\"authors\":\"E. Pankratov\",\"doi\":\"10.11591/ijaas.v11.i2.pp126-145\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, we introduce an approach to increase the density of field-effect transistors framework nulling-resistor output amplifier. In the framework of the approach, we consider manufacturing the amplifier in a heterostructure with a specific configuration. Several required areas of the heterostructure should be doped by diffusion or ion implantation. After that dopant and radiation defects should be annealed framework optimized scheme. We also consider an approach to decrease the value of mismatch-induced stress in the considered heterostructure. We introduce an analytical approach to analyze mass and heat transport in heterostructures during the manufacturing of integrated circuits with account for mismatch-induced stress. \",\"PeriodicalId\":44367,\"journal\":{\"name\":\"International Journal of Advances in Engineering Sciences and Applied Mathematics\",\"volume\":\"15 4 1\",\"pages\":\"\"},\"PeriodicalIF\":1.2000,\"publicationDate\":\"2022-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Journal of Advances in Engineering Sciences and Applied Mathematics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.11591/ijaas.v11.i2.pp126-145\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"ENGINEERING, MULTIDISCIPLINARY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Journal of Advances in Engineering Sciences and Applied Mathematics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.11591/ijaas.v11.i2.pp126-145","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, MULTIDISCIPLINARY","Score":null,"Total":0}
A nulling-resistor output amplifier in the framework of heterostructures based on nonlinear partial differential equations
In this paper, we introduce an approach to increase the density of field-effect transistors framework nulling-resistor output amplifier. In the framework of the approach, we consider manufacturing the amplifier in a heterostructure with a specific configuration. Several required areas of the heterostructure should be doped by diffusion or ion implantation. After that dopant and radiation defects should be annealed framework optimized scheme. We also consider an approach to decrease the value of mismatch-induced stress in the considered heterostructure. We introduce an analytical approach to analyze mass and heat transport in heterostructures during the manufacturing of integrated circuits with account for mismatch-induced stress.
期刊介绍:
International Journal of Advances in Engineering Sciences and Applied Mathematics will be a thematic journal, where each issue will be dedicated to a specific area of engineering and applied mathematics. The journal will accept original articles and will also publish review article that summarize the state of the art and provide a perspective on areas of current research interest.Articles that contain purely theoretical results are discouraged.