子带隙态的载流子脱陷:用超快泵浦-探针光谱揭示的InGaN/GaN体系的新机制

Tarni Aggarwal, S. Ganguly, D. Saha
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引用次数: 0

摘要

氮化镓基量子受限结构中的亚带隙态并不总是不利于有效的光发射。通过库仑相互作用证明了载流子从亚带隙状态恢复的一种新的内在机制。铟的非均质性被确定为载流子储层,可以为未来的再组合保留载流子。电子从这些状态中脱出的概率是有限的,而不是通过相反的电荷重新组合。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Carrier De-trapping from the Sub-bandgap States: A novel mechanism in InGaN/GaN systems manifested by ultrafast pump-probe spectroscopy
Sub-bandgap states in GaN-based quantum confined structures are not always disadvantageous for efficient light emission. A novel intrinsic mechanism of carrier recovery from sub-bandgap states through Coulombic interaction is proven. Indium inhomogeneity is established as carrier reservoirs that can hold carriers for future recombination. There is a finite probability of electron de-trapping from these states, instead of recombining through opposite charge.
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