减少组合电路的测试输入

[1991] Proceedings of the 34th Midwest Symposium on Circuits and Systems Pub Date : 1991-05-14 DOI:10.1109/MWSCAS.1991.252073

B. Karimi, L. G. Johnson

{"title":"减少组合电路的测试输入","authors":"B. Karimi, L. G. Johnson","doi":"10.1109/MWSCAS.1991.252073","DOIUrl":null,"url":null,"abstract":"For a given method of design for testability a mechanism is proposed to reduce the number of test inputs by connecting two or more test inputs together. It is shown that by preprocessing the reconvergent fanouts it is possible to identify and remove some of the redundant reconvergent paths. Reconvergent fanouts with multiple reconvergent gates are investigated, and their application in design for testability is discussed.<<ETX>>","PeriodicalId":6453,"journal":{"name":"[1991] Proceedings of the 34th Midwest Symposium on Circuits and Systems","volume":"8 1","pages":"874-878 vol.2"},"PeriodicalIF":0.0000,"publicationDate":"1991-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Reduction of test inputs for combinational circuits\",\"authors\":\"B. Karimi, L. G. Johnson\",\"doi\":\"10.1109/MWSCAS.1991.252073\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"For a given method of design for testability a mechanism is proposed to reduce the number of test inputs by connecting two or more test inputs together. It is shown that by preprocessing the reconvergent fanouts it is possible to identify and remove some of the redundant reconvergent paths. Reconvergent fanouts with multiple reconvergent gates are investigated, and their application in design for testability is discussed.<<ETX>>\",\"PeriodicalId\":6453,\"journal\":{\"name\":\"[1991] Proceedings of the 34th Midwest Symposium on Circuits and Systems\",\"volume\":\"8 1\",\"pages\":\"874-878 vol.2\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-05-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"[1991] Proceedings of the 34th Midwest Symposium on Circuits and Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MWSCAS.1991.252073\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"[1991] Proceedings of the 34th Midwest Symposium on Circuits and Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWSCAS.1991.252073","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 0

摘要

对于给定的可测试性设计方法，提出了一种通过将两个或多个测试输入连接在一起来减少测试输入数量的机制。结果表明，通过对再收敛扇输出进行预处理，可以识别和去除一些冗余的再收敛路径。研究了具有多个再收敛门的再收敛扇出，并讨论了它们在可测试性设计中的应用

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Reduction of test inputs for combinational circuits

For a given method of design for testability a mechanism is proposed to reduce the number of test inputs by connecting two or more test inputs together. It is shown that by preprocessing the reconvergent fanouts it is possible to identify and remove some of the redundant reconvergent paths. Reconvergent fanouts with multiple reconvergent gates are investigated, and their application in design for testability is discussed.<>

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[1991] Proceedings of the 34th Midwest Symposium on Circuits and Systems

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