La, Ce, Th掺杂二维SiC的光电性质:第一性原理研究

Yan Wanjun, Qin Xinmao, Zhang Chunhong, Z. Zhongzheng, Zhou Shiyun
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引用次数: 2

摘要

采用第一性原理法研究了La、Ce和Th掺杂二维SiC的几何结构、能带结构、态密度和光学性质。几何结构结果表明,所有掺杂原子都会对掺杂原子附近的晶格造成明显的畸变,畸变程度与不同掺杂原子的共价半径有关。纯2D SiC是一种直接隙半导体,隙为2.60 eV。在费米能量附近,态密度主要由C-2p和Si-3p组成。当掺杂La、Ce和Th后,二维SiC的带隙减小,都变成准直接带隙半导体。La掺杂和Th掺杂的2D SiC的价带分别主要由C-2p、Si-3p、La-5d和Th-6d组成,而ce掺杂对2D SiC的价带影响不大。La、Ce和Th掺杂的二维SiC的导带分别主要由Si-3p、La-5d、Ce-4f和Th-6s6d5f组成。当硅原子被稀土原子取代时,稀土原子失去电荷。稀土原子与C原子的共价键较弱,而离子键的共价键较强。在所有研究的体系中,la掺杂的2D SiC具有最大的静态介电常数2.33,低能区e2(ω)的最大峰,最大折射率n0 1.53。掺ce的2D SiC在低能区的最大吸收为6.88 × 104 cm-1。La或Ce掺杂的2D SiC在低能级吸收增强,而th掺杂的2D SiC在0 ~ 15 eV范围内吸收减弱。研究结果将为二维碳化硅的发展和应用提供一定的理论指导。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Photoelectric Properties of La, Ce, Th Doped 2D SiC: A First Principle Study
The geometrical structure, energy band structure, density of states and optical properties of La, Ce and Th doped two-dimensional (2D) SiC are investigated by using the first-principle method. Geometrical structure results show that all of the doping atoms cause obvious distortion of the crystal lattice near the doping atoms, and the degree of distortion is related to the covalent radius of different doping atoms. The pure 2D SiC is a direct-gap semiconductor with a gap of 2.60 eV. Near the Fermi energy, the density of states is mainly composed of C-2p and Si-3p. When doping with La, Ce and Th, the band gap of 2D SiC decreased and all of them turn into quasi-direct band-gap semiconductors. The valence band of La and Th doped 2D SiC are mainly composed of C-2p, Si-3p, La-5d and Th-6d, respectively, while Ce-doped has little effect on the valence band of 2D SiC. The conduction band of La, Ce and Th doped 2D SiC are mainly composed of Si-3p, La-5d, Ce-4f and Th-6s6d5f, respectively. When Si atom is replaced by rare earth atom, the rare earth atoms lose their charges. The bond of rare earth atom and C atom has weak covalent, while ionic is stronger. Among all of the studied systems, La-doped 2D SiC has the biggest static dielectric constant 2.33, the biggest peak of e2(ω) in the low energy region, the maximum refractive index n0 1.53. Ce-doped 2D SiC has the maximum absorption 6.88 × 104 cm-1 in the lower energy region. La or Ce doped 2D SiC can enhance the absorption in the lower energy region, while Th-doped will decrease the absorption of 2D SiC in the range of 0 ~ 15 eV. The research results will provide some theoretical guidance for the development and application of 2D SiC.
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