表面粗糙度对增材制造零件x射线计算机断层扫描尺寸测量的影响

Valentina Aloisi, Simone Carmignato
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引用次数: 43

摘要

在许多工业应用中,以高表面粗糙度为特征的部件是通过x射线计算机断层扫描(CT)测量的。例如,增材制造的零件就是这种情况。表面粗糙度对CT尺寸测量有很强的影响,相对于三坐标测量机(cmm)的触觉参考测量会产生相关的测量偏差,特别是对于具有高表面粗糙度特征的零件。因此,粗糙度对CT尺寸测量的影响必须量化。本文研究了表面粗糙度对CT尺寸测量的影响,以及触觉三坐标测量机与CT测量的关系。通过三种不同的添加剂制造样品,以不同的粗糙度为特征,考虑了较大和较小表面粗糙度的影响。实验结果证明了触觉测量与CT测量之间存在系统误差;分析了该误差与表面Rz粗糙度参数的关系。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Influence of surface roughness on X-ray computed tomography dimensional measurements of additive manufactured parts

In many industrial applications, components characterized by high surface roughness are measured by X-ray computed tomography (CT). This is the case, for example, of additive manufactured parts. Surface roughness has a strong influence on CT dimensional measurements, causing relevant measurement deviations with respect to tactile reference measurements by coordinate measuring machines (CMMs), especially for parts characterized by high surface roughness. It comes that roughness effects on CT dimensional measurements must be quantified.

In this work, the influence of surface roughness on CT dimensional measurements, and the relation between tactile CMM and CT measurements are studied. Effects of larger as well as smaller surface roughness are taken into account, by means of three different additive manufactured samples characterized by different roughness. Experimental results prove the presence of a systematic error between tactile and CT measurements; the relation between this error and the Rz roughness parameter of the surface is analyzed.

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