掺杂硅纳米晶体的电学和光学性质的相关性

IF 0.6 4区 材料科学 Q4 MATERIALS SCIENCE, MULTIDISCIPLINARY
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引用次数: 0

摘要

通过这项工作,我们提出了一种相关方法,可以根据文献中发表的实验数据确定掺杂硅纳米晶体的折射率和暗电导率方面的光学和电性能之间的半经验关系。首先,推导了掺杂硅纳米晶体的电导率和带隙的解析模型。利用折射率与带隙能量相关的经验表达式,我们将n型纳米晶硅的电学和光学参数与半经验表达式关联起来。发现半经验关系正确地解释了实验结果,并在n型硅纳米晶体薄膜的带隙能量变化区间内得到了相当好的一致性。计算了带隙能为1的n型硅纳米晶体薄膜的拟合参数值。7 eV和2.2 eV。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
CORRELATION BETWEEN ELECTRICAL AND OPTICAL PROPERTIES OF DOPED SILICON NANOCRYSTALS
We propose through this work a correlation method leading to a determination of a semi-empirical relationship between optical and electrical properties in terms of refractive index and dark conductivity of doped silicon nanocrystals based on experimental data published in literature. First, an analytical model relating the conductivity and bandgap of doped silicon nanocrystals was derived. Using an empirical expression relating the refractive index to the bandgap energy, we correlated the electrical and optical parameters of N-type nanocrystalline silicon with a semi-empirical expression. The semi-empirical relationship was found to account correctly for the experimental results and yield a reasonably good agreement in an interval of the bandgap energy variation of N-type silicon nanocrystal films. The values of the fitting parameters were calculated for the N-type silicon nanocrystal films having their bandgap energy between 1. 7 eV and 2.2 eV.
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来源期刊
Materiali in tehnologije
Materiali in tehnologije 工程技术-材料科学:综合
CiteScore
1.30
自引率
0.00%
发文量
73
审稿时长
4-8 weeks
期刊介绍: The journal MATERIALI IN TEHNOLOGIJE/MATERIALS AND TECHNOLOGY is a scientific journal, devoted to original papers and review scientific papers concerned with the areas of fundamental and applied science and technology. Topics of particular interest include metallic materials, inorganic materials, polymers, vacuum technique and lately nanomaterials.
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