石墨烯与二硫化钼的导电异质结器件

R. Tomar, Kajol Taiwade, P. Ojha
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引用次数: 0

摘要

本文报道了用二维带与G带的强度比来估计石墨烯的厚度,该比值为1.91,表明它是单层和双层的二硫化钼。考虑到高D/G比,RAMAN光谱显示存在晶体缺陷。所合成的异质结构器件呈现线性导电性,使其成为导电器件。这些器件为新一代透明、高性能、高响应气体传感器和光电子器件展示了一个有前途的器件。石墨烯和二硫化钼的异质结构器件在光电探测器和光电晶体管中显示出增强性能的前景;具有静电耦合和大电流容量。该合成方法通过在石墨烯上生长大规模均匀的MoS2,在铜箔上制备了MoS2/石墨烯。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
The conductive heterojunctuon device of graphene and MoS2
This paper reports the estimation of graphene thickness, done by the intensity ratio of the 2D band to the G band and the ration is found to be 1.91 which suggests, it is monolayer and bilayer MoS2. The RAMAN spectra shows presence of crystalline defects, considering high D/G ratio. The heterostructure device synthesized shows linear conductivity, making it a conductive device. These devices exhibit a promising device for a new generation of transparent, high performance, high response gas sensors and optoelectronic devices. The heterostructure device of graphene and MoS2 show promise for enhanced performance in photo detectors and phototransistors; with electrostatic coupling and high current capacity. This synthesis approach is used to fabricate a MoS2/Graphene on copper foil by growing large scale uniform MoS2 on graphene.
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