M. Naftaly, N. Ridler, J. Molloy, N. Shoaib, Daniel Stokes
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A comparison method for THz measurements using VNA and TDS
A method is described for direct comparison of dielectric measurements obtained by a vector network analyzer and a time domain spectrometer. The method employs a material that can be inserted into a waveguide for VNA measurements or contained in a cell for TDS measurements.