铁电薄膜与超导氧化物的脉冲激光沉积(PLD)

S. Sengupta, L. Sengupta, W. E. Kosik
{"title":"铁电薄膜与超导氧化物的脉冲激光沉积(PLD)","authors":"S. Sengupta, L. Sengupta, W. E. Kosik","doi":"10.1109/ISAF.1994.522394","DOIUrl":null,"url":null,"abstract":"The possibility of combining ferroelectrics and superconductors has been of interest for use in memory storage devices. Additionally, superconductors offer crystal structures compatible to the epitaxial growth of the ferroelectric, Ba/sub 0.6/Sr/sub 0.4/TiO/sub 3/ (BSTO), which is cubic at this stoichiometry. BSTO has a lattice constant of 3.94 /spl Aring/ as compared to the superconducting Pr/sub 2-x/Ce/sub x/CuO/sub 4/ tetragonal single crystal which also has a lattice constant of a=3.94 /spl Aring/. In this study, ferroelectric thin films of BSTO were deposited on single crystals of Pr/sub 2/CuO/sub 4/ and Pr/sub 2-x/Ce/sub x/CuO/sub 4/. The optical constants of the substrates, single crystals of Pr/sub 2/CuO/sub 4/ and Pr/sub 2-x/Ce/sub x/CuO/sub 4/, were determined using Variable Angle Spectroscopic Ellipsometry (VASE) and the composition and crystal structure were examined using Rutherford Backscattering Spectrometry (RBS) with ion beam channeling. The substrate/film interfaces and the compositional variation in the films were also studied with RBS and with SEM/EDS. Glancing angle X-ray diffraction was used to verify the epitaxial nature of the films. The effect of the deposition parameters (laser repetition rate, oxygen backfill pressure, and deposition geometry) on the quality of the films was experimented with and the optimized parameters were used.","PeriodicalId":20488,"journal":{"name":"Proceedings of 1994 IEEE International Symposium on Applications of Ferroelectrics","volume":"40 1","pages":"431-434"},"PeriodicalIF":0.0000,"publicationDate":"1994-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Pulsed laser deposition (PLD) of ferroelectric thin films in conjunction with superconducting oxides\",\"authors\":\"S. Sengupta, L. Sengupta, W. E. Kosik\",\"doi\":\"10.1109/ISAF.1994.522394\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The possibility of combining ferroelectrics and superconductors has been of interest for use in memory storage devices. Additionally, superconductors offer crystal structures compatible to the epitaxial growth of the ferroelectric, Ba/sub 0.6/Sr/sub 0.4/TiO/sub 3/ (BSTO), which is cubic at this stoichiometry. BSTO has a lattice constant of 3.94 /spl Aring/ as compared to the superconducting Pr/sub 2-x/Ce/sub x/CuO/sub 4/ tetragonal single crystal which also has a lattice constant of a=3.94 /spl Aring/. In this study, ferroelectric thin films of BSTO were deposited on single crystals of Pr/sub 2/CuO/sub 4/ and Pr/sub 2-x/Ce/sub x/CuO/sub 4/. The optical constants of the substrates, single crystals of Pr/sub 2/CuO/sub 4/ and Pr/sub 2-x/Ce/sub x/CuO/sub 4/, were determined using Variable Angle Spectroscopic Ellipsometry (VASE) and the composition and crystal structure were examined using Rutherford Backscattering Spectrometry (RBS) with ion beam channeling. The substrate/film interfaces and the compositional variation in the films were also studied with RBS and with SEM/EDS. Glancing angle X-ray diffraction was used to verify the epitaxial nature of the films. The effect of the deposition parameters (laser repetition rate, oxygen backfill pressure, and deposition geometry) on the quality of the films was experimented with and the optimized parameters were used.\",\"PeriodicalId\":20488,\"journal\":{\"name\":\"Proceedings of 1994 IEEE International Symposium on Applications of Ferroelectrics\",\"volume\":\"40 1\",\"pages\":\"431-434\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-08-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of 1994 IEEE International Symposium on Applications of Ferroelectrics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISAF.1994.522394\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 1994 IEEE International Symposium on Applications of Ferroelectrics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISAF.1994.522394","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

将铁电体和超导体结合在一起的可能性已引起人们对存储器存储装置的兴趣。此外,超导体提供了与铁电晶体Ba/sub 0.6/Sr/sub 0.4/TiO/sub 3/ (BSTO)外延生长相容的晶体结构,在这种化学统计下,它是立方的。与超导的Pr/sub - 2-x/Ce/sub -x/ CuO/sub - 4/四方单晶相比,BSTO的晶格常数为3.94 /spl Aring/。本研究在Pr/sub - 2/CuO/sub - 4/和Pr/sub - 2-x/Ce/sub -x/ CuO/sub - 4/单晶上沉积了BSTO铁电薄膜。利用变角椭圆偏振仪(VASE)测定了Pr/sub 2/CuO/sub 4/和Pr/sub 2-x/Ce/sub x/CuO/sub 4/单晶的光学常数,并利用离子束通道卢塞福后向散射光谱(RBS)检测了其组成和晶体结构。利用RBS和SEM/EDS研究了衬底/薄膜界面和薄膜成分的变化。用掠射角x射线衍射验证了薄膜的外延性质。实验了沉积参数(激光重复频率、氧充填压力和沉积几何形状)对薄膜质量的影响,并采用了优化后的参数。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Pulsed laser deposition (PLD) of ferroelectric thin films in conjunction with superconducting oxides
The possibility of combining ferroelectrics and superconductors has been of interest for use in memory storage devices. Additionally, superconductors offer crystal structures compatible to the epitaxial growth of the ferroelectric, Ba/sub 0.6/Sr/sub 0.4/TiO/sub 3/ (BSTO), which is cubic at this stoichiometry. BSTO has a lattice constant of 3.94 /spl Aring/ as compared to the superconducting Pr/sub 2-x/Ce/sub x/CuO/sub 4/ tetragonal single crystal which also has a lattice constant of a=3.94 /spl Aring/. In this study, ferroelectric thin films of BSTO were deposited on single crystals of Pr/sub 2/CuO/sub 4/ and Pr/sub 2-x/Ce/sub x/CuO/sub 4/. The optical constants of the substrates, single crystals of Pr/sub 2/CuO/sub 4/ and Pr/sub 2-x/Ce/sub x/CuO/sub 4/, were determined using Variable Angle Spectroscopic Ellipsometry (VASE) and the composition and crystal structure were examined using Rutherford Backscattering Spectrometry (RBS) with ion beam channeling. The substrate/film interfaces and the compositional variation in the films were also studied with RBS and with SEM/EDS. Glancing angle X-ray diffraction was used to verify the epitaxial nature of the films. The effect of the deposition parameters (laser repetition rate, oxygen backfill pressure, and deposition geometry) on the quality of the films was experimented with and the optimized parameters were used.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信