{"title":"13.3 mW 60 MHz带宽,76 dB DR 6 GS/s CTΔΣM,时间交错FIR反馈","authors":"Ankesh Jain, S. Pavan","doi":"10.1109/VLSIC.2016.7573466","DOIUrl":null,"url":null,"abstract":"We present a wideband single-bit CTΔΣM that uses a 2× time-interleaved quantizer and FIR DAC. Time interleaving reduces power dissipation and regeneration errors of the FIR DAC when compared to a full rate implementation. Fabricated in a low leakage 65nm CMOS, the prototype modulator operates at 6 GS/s and achieves 67.6/76 dB SNDR/DR in a 60 MHz bandwidth while consuming 13.3 mW. The FoM is 56.5 fJ/conv-step.","PeriodicalId":6512,"journal":{"name":"2016 IEEE Symposium on VLSI Circuits (VLSI-Circuits)","volume":"50 1","pages":"1-2"},"PeriodicalIF":0.0000,"publicationDate":"2016-06-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"13","resultStr":"{\"title\":\"A 13.3 mW 60 MHz bandwidth, 76 dB DR 6 GS/s CTΔΣM with time interleaved FIR feedback\",\"authors\":\"Ankesh Jain, S. Pavan\",\"doi\":\"10.1109/VLSIC.2016.7573466\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We present a wideband single-bit CTΔΣM that uses a 2× time-interleaved quantizer and FIR DAC. Time interleaving reduces power dissipation and regeneration errors of the FIR DAC when compared to a full rate implementation. Fabricated in a low leakage 65nm CMOS, the prototype modulator operates at 6 GS/s and achieves 67.6/76 dB SNDR/DR in a 60 MHz bandwidth while consuming 13.3 mW. The FoM is 56.5 fJ/conv-step.\",\"PeriodicalId\":6512,\"journal\":{\"name\":\"2016 IEEE Symposium on VLSI Circuits (VLSI-Circuits)\",\"volume\":\"50 1\",\"pages\":\"1-2\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-06-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"13\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE Symposium on VLSI Circuits (VLSI-Circuits)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VLSIC.2016.7573466\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE Symposium on VLSI Circuits (VLSI-Circuits)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSIC.2016.7573466","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 13
摘要
我们提出了一种宽带单比特CTΔΣM,它使用2倍时间交错量化器和FIR DAC。与全速率实现相比,时间交错减少了FIR DAC的功耗和再生错误。该原型调制器采用低漏65nm CMOS制造,工作速度为6 GS/s,在60 MHz带宽下实现67.6/76 dB SNDR/DR,功耗为13.3 mW。FoM为56.5 fJ/反步。
A 13.3 mW 60 MHz bandwidth, 76 dB DR 6 GS/s CTΔΣM with time interleaved FIR feedback
We present a wideband single-bit CTΔΣM that uses a 2× time-interleaved quantizer and FIR DAC. Time interleaving reduces power dissipation and regeneration errors of the FIR DAC when compared to a full rate implementation. Fabricated in a low leakage 65nm CMOS, the prototype modulator operates at 6 GS/s and achieves 67.6/76 dB SNDR/DR in a 60 MHz bandwidth while consuming 13.3 mW. The FoM is 56.5 fJ/conv-step.