Siming Li, R. Farshchi, Michael F. Miller, A. Arehart, D. Kuciauskas
{"title":"高效(Ag, Cu)(in, Ga)Se2中缺陷的光学表征","authors":"Siming Li, R. Farshchi, Michael F. Miller, A. Arehart, D. Kuciauskas","doi":"10.2172/1808862","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":6773,"journal":{"name":"2020 47th IEEE Photovoltaic Specialists Conference (PVSC)","volume":"10 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2020-06-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Optical Characterization of Defects in High-efficiency (Ag, Cu)(In, Ga)Se2\",\"authors\":\"Siming Li, R. Farshchi, Michael F. Miller, A. Arehart, D. Kuciauskas\",\"doi\":\"10.2172/1808862\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":6773,\"journal\":{\"name\":\"2020 47th IEEE Photovoltaic Specialists Conference (PVSC)\",\"volume\":\"10 1\",\"pages\":\"\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-06-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 47th IEEE Photovoltaic Specialists Conference (PVSC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.2172/1808862\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 47th IEEE Photovoltaic Specialists Conference (PVSC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.2172/1808862","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}