{"title":"太赫兹近场显微镜在器件研究中的应用","authors":"O. Mitrofanov","doi":"10.1109/IRMMW-THZ.2011.6105086","DOIUrl":null,"url":null,"abstract":"THz near-field microscopy can make a large impact on development of THz technology. Sub-wavelength spatial resolution and the possibility of time-domain analysis make this method particularly useful in research on THz devices. Applications for device research, including mode analysis in waveguides and surface plasmon wave mapping will be discussed.","PeriodicalId":6353,"journal":{"name":"2011 International Conference on Infrared, Millimeter, and Terahertz Waves","volume":"30 1","pages":"1-3"},"PeriodicalIF":0.0000,"publicationDate":"2011-12-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"THz near-field microscopy applications in device research\",\"authors\":\"O. Mitrofanov\",\"doi\":\"10.1109/IRMMW-THZ.2011.6105086\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"THz near-field microscopy can make a large impact on development of THz technology. Sub-wavelength spatial resolution and the possibility of time-domain analysis make this method particularly useful in research on THz devices. Applications for device research, including mode analysis in waveguides and surface plasmon wave mapping will be discussed.\",\"PeriodicalId\":6353,\"journal\":{\"name\":\"2011 International Conference on Infrared, Millimeter, and Terahertz Waves\",\"volume\":\"30 1\",\"pages\":\"1-3\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-12-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 International Conference on Infrared, Millimeter, and Terahertz Waves\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IRMMW-THZ.2011.6105086\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 International Conference on Infrared, Millimeter, and Terahertz Waves","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IRMMW-THZ.2011.6105086","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
THz near-field microscopy applications in device research
THz near-field microscopy can make a large impact on development of THz technology. Sub-wavelength spatial resolution and the possibility of time-domain analysis make this method particularly useful in research on THz devices. Applications for device research, including mode analysis in waveguides and surface plasmon wave mapping will be discussed.
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