浸涂速度对石墨烯修饰ZnO薄膜忆阻器的影响

Nur Izzati Binti Izam, Tengku Norazman Tengku Abd Aziz, Rohanieza Abdul Rahman, M. F. Malek, S. H. Herman, Z. Zulkifli
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引用次数: 4

摘要

zno -石墨烯材料已被证明具有忆阻效应。因此,在这种材料的器件中具有良好的记忆性能,在非易失性存储器应用中具有潜力。然而,人们对纳米结构在提高器件导电性从而改善其性能方面的重要性知之甚少。本文采用浸涂法研究了ZnO修饰石墨烯薄膜的电学、光学和形态学特性。样品浸泡5次30秒,每次250℃退火10分钟,观察到纳米片结构。这些样品比没有纳米结构的样品具有更高的电流。总体结果表明,ZnO和石墨烯的纳米结构使电流大大提高了16 × 106个数量级,从而提高了电阻比为1.18的记忆电阻行为。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
The effect of dip-coating speed on Graphene decorated ZnO films for memristor application
ZnO-Graphene material has been proven to show the effect of memristive behaviour. Consequently, a good memristive performance in devices of such materials has the potential in non-volatile memory applications. However, little is known about the significance of nanostructure in making the devices more conductive, thereby improving their performance. Here, we show the electrical, optical and morphological properties of ZnO decorated Graphene film for memristive device by using dip-coating method. Nanoflake structure was observed in samples that had been immersed 5 times for 30 seconds and annealed each time at 250°C for 10 minutes. These samples have higher current than that of samples without the nanostructure. The overall results demonstrate that the nanostructure ZnO and Graphene have greatly improved the current by 16 × 106 order of magnitude, thereby giving rise to improved memristive behaviour with resistance ratio of 1.18.
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