{"title":"厚膜电阻器的应变灵敏度非常高:真实和虚假的超规系数","authors":"M. Prudenziati, B. Morten, F. Cilloni, G. Ruffi","doi":"10.1016/0250-6874(89)87089-1","DOIUrl":null,"url":null,"abstract":"<div><p>An investigation has been carried out on the correlations between composition/morphology of RuO<sub>2</sub>-based thick-film resistors and their strain sensitivity. Very high gauge factors (<em>GFs</em>), as well as satisfactory performance in terms of <em>TCR</em> (temperature coefficient of resistance), excess noise and reliability, are obtained with an appropriate choice of glassy matrix, RuO<sub>2</sub> grain size and concentrations. Resistive systems modified with metal and metal oxide additions are also analysed. In some cases notable changes of electrical properties are observed, related to defective structures. Methods for a simple and accurate diagnosis of reliable or fictitious performance of thick-film strain gauges are identified.</p></div>","PeriodicalId":101159,"journal":{"name":"Sensors and Actuators","volume":"19 4","pages":"Pages 401-414"},"PeriodicalIF":0.0000,"publicationDate":"1989-09-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0250-6874(89)87089-1","citationCount":"36","resultStr":"{\"title\":\"Very high strain sensitivity in thick-film resistors: real and false super gauge factors\",\"authors\":\"M. Prudenziati, B. Morten, F. Cilloni, G. Ruffi\",\"doi\":\"10.1016/0250-6874(89)87089-1\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>An investigation has been carried out on the correlations between composition/morphology of RuO<sub>2</sub>-based thick-film resistors and their strain sensitivity. Very high gauge factors (<em>GFs</em>), as well as satisfactory performance in terms of <em>TCR</em> (temperature coefficient of resistance), excess noise and reliability, are obtained with an appropriate choice of glassy matrix, RuO<sub>2</sub> grain size and concentrations. Resistive systems modified with metal and metal oxide additions are also analysed. In some cases notable changes of electrical properties are observed, related to defective structures. Methods for a simple and accurate diagnosis of reliable or fictitious performance of thick-film strain gauges are identified.</p></div>\",\"PeriodicalId\":101159,\"journal\":{\"name\":\"Sensors and Actuators\",\"volume\":\"19 4\",\"pages\":\"Pages 401-414\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1989-09-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://sci-hub-pdf.com/10.1016/0250-6874(89)87089-1\",\"citationCount\":\"36\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Sensors and Actuators\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/0250687489870891\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Sensors and Actuators","FirstCategoryId":"1085","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/0250687489870891","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Very high strain sensitivity in thick-film resistors: real and false super gauge factors
An investigation has been carried out on the correlations between composition/morphology of RuO2-based thick-film resistors and their strain sensitivity. Very high gauge factors (GFs), as well as satisfactory performance in terms of TCR (temperature coefficient of resistance), excess noise and reliability, are obtained with an appropriate choice of glassy matrix, RuO2 grain size and concentrations. Resistive systems modified with metal and metal oxide additions are also analysed. In some cases notable changes of electrical properties are observed, related to defective structures. Methods for a simple and accurate diagnosis of reliable or fictitious performance of thick-film strain gauges are identified.
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