氟化石墨烯上o原子扩散的第一性原理计算

IF 0.8 4区 物理与天体物理 Q3 PHYSICS, MULTIDISCIPLINARY
Hailin Yang, Qili Chen, Xing Gu, Ning Lin
{"title":"氟化石墨烯上o原子扩散的第一性原理计算","authors":"Hailin Yang, Qili Chen, Xing Gu, Ning Lin","doi":"10.7498/aps.72.20221630","DOIUrl":null,"url":null,"abstract":"Fluorination of graphene is one of the most effective methods to improve the corrosion protection of graphene coatings. In this paper, the diffusion and penetration behaviors of O atoms on fully fluorinated graphene (CF) and partially fluorinated graphene (C4F) were investigated using the NEB transition state search method. The effects of F atoms on the corrosion resistance of fluorinated graphene films were analyzed either. The results show that the adsorption of F atoms can effectively inhibit the diffusion of O atoms on graphene. On C4F, the F atoms are distributed in a para-top position, which greatly increases the surface diffusion energy barrier of O atoms. Moreover, it is difficult for the adsorbed O atoms to diffuse to different sp2 C rings through the obstruction of F atoms. The energy barrier of the horizontal diffusion of O atoms even reaches 2.69 eV in CF. And with the increase of F atoms, the stable structure of graphene is gradually destroyed, the barrier ability of C-atom layer for penetration behaviors of O atoms is greatly reduced. Furthermore, the interfacial adhesion work of pure graphene, CF and C4F films with Cu(111) surfaces were calculated, as well as the electronic structures of the composite interface using first-principles calculations. The interfacial adhesion work of the Cu/G, Cu/C4F and Cu/CF interfaces are 2.626J/m2、3.529J/m2and 3.559J/m2, respectively. The calculations show that the bonding of C4F and C4F with Cu substrate are more strong than pure graphene with Cu substrate, and the interfacial adhesion work increase with increasing of F atom adsorption concentration. The calculation of the density of states also conform stronger interaction between Cu and C atoms of the Cu/C4F interface than that of the Cu/CF interface. Bader charge analysis show increased charge transfer at both the Cu/C4F and Cu/CF interfaces comparing with the Cu/G interface, and Cu/C4F interface has more charge transfer, in which Cu-C bonds are formed.","PeriodicalId":6995,"journal":{"name":"物理学报","volume":"234 1","pages":""},"PeriodicalIF":0.8000,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"First-principles calculations on O-atom diffusion on fluorinated graphene\",\"authors\":\"Hailin Yang, Qili Chen, Xing Gu, Ning Lin\",\"doi\":\"10.7498/aps.72.20221630\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Fluorination of graphene is one of the most effective methods to improve the corrosion protection of graphene coatings. In this paper, the diffusion and penetration behaviors of O atoms on fully fluorinated graphene (CF) and partially fluorinated graphene (C4F) were investigated using the NEB transition state search method. The effects of F atoms on the corrosion resistance of fluorinated graphene films were analyzed either. The results show that the adsorption of F atoms can effectively inhibit the diffusion of O atoms on graphene. On C4F, the F atoms are distributed in a para-top position, which greatly increases the surface diffusion energy barrier of O atoms. Moreover, it is difficult for the adsorbed O atoms to diffuse to different sp2 C rings through the obstruction of F atoms. The energy barrier of the horizontal diffusion of O atoms even reaches 2.69 eV in CF. And with the increase of F atoms, the stable structure of graphene is gradually destroyed, the barrier ability of C-atom layer for penetration behaviors of O atoms is greatly reduced. Furthermore, the interfacial adhesion work of pure graphene, CF and C4F films with Cu(111) surfaces were calculated, as well as the electronic structures of the composite interface using first-principles calculations. The interfacial adhesion work of the Cu/G, Cu/C4F and Cu/CF interfaces are 2.626J/m2、3.529J/m2and 3.559J/m2, respectively. The calculations show that the bonding of C4F and C4F with Cu substrate are more strong than pure graphene with Cu substrate, and the interfacial adhesion work increase with increasing of F atom adsorption concentration. The calculation of the density of states also conform stronger interaction between Cu and C atoms of the Cu/C4F interface than that of the Cu/CF interface. Bader charge analysis show increased charge transfer at both the Cu/C4F and Cu/CF interfaces comparing with the Cu/G interface, and Cu/C4F interface has more charge transfer, in which Cu-C bonds are formed.\",\"PeriodicalId\":6995,\"journal\":{\"name\":\"物理学报\",\"volume\":\"234 1\",\"pages\":\"\"},\"PeriodicalIF\":0.8000,\"publicationDate\":\"2023-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"物理学报\",\"FirstCategoryId\":\"101\",\"ListUrlMain\":\"https://doi.org/10.7498/aps.72.20221630\",\"RegionNum\":4,\"RegionCategory\":\"物理与天体物理\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"PHYSICS, MULTIDISCIPLINARY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"物理学报","FirstCategoryId":"101","ListUrlMain":"https://doi.org/10.7498/aps.72.20221630","RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"PHYSICS, MULTIDISCIPLINARY","Score":null,"Total":0}
引用次数: 0

摘要

石墨烯氟化是提高石墨烯涂层防腐性能的最有效方法之一。本文采用NEB过渡态搜索方法研究了O原子在全氟化石墨烯(CF)和部分氟化石墨烯(C4F)上的扩散和渗透行为。分析了F原子对氟化石墨烯薄膜耐腐蚀性能的影响。结果表明,F原子的吸附能有效抑制O原子在石墨烯上的扩散。在C4F上,F原子呈顶状分布,极大地提高了O原子的表面扩散能垒。此外,由于F原子的阻挡,吸附的O原子很难扩散到不同的sp2 C环上。在CF中,O原子水平扩散的能垒甚至达到2.69 eV,并且随着F原子的增加,石墨烯的稳定结构逐渐被破坏,c原子层对O原子穿透行为的势垒能力大大降低。此外,利用第一性原理计算计算了纯石墨烯、CF和C4F薄膜与Cu(111)表面的界面粘附功,以及复合界面的电子结构。Cu/G、Cu/C4F和Cu/CF界面的界面粘附功分别为2.626J/m2、3.529J/m2和3.559J/m2。计算表明,C4F和C4F与Cu衬底的结合比纯石墨烯与Cu衬底的结合更强,界面粘附功随着F原子吸附浓度的增加而增加。态密度的计算也证实Cu/C4F界面中Cu和C原子之间的相互作用强于Cu/CF界面。Bader电荷分析表明,Cu/C4F和Cu/CF界面的电荷转移均比Cu/G界面增加,Cu/C4F界面的电荷转移更多,并形成Cu- c键。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
First-principles calculations on O-atom diffusion on fluorinated graphene
Fluorination of graphene is one of the most effective methods to improve the corrosion protection of graphene coatings. In this paper, the diffusion and penetration behaviors of O atoms on fully fluorinated graphene (CF) and partially fluorinated graphene (C4F) were investigated using the NEB transition state search method. The effects of F atoms on the corrosion resistance of fluorinated graphene films were analyzed either. The results show that the adsorption of F atoms can effectively inhibit the diffusion of O atoms on graphene. On C4F, the F atoms are distributed in a para-top position, which greatly increases the surface diffusion energy barrier of O atoms. Moreover, it is difficult for the adsorbed O atoms to diffuse to different sp2 C rings through the obstruction of F atoms. The energy barrier of the horizontal diffusion of O atoms even reaches 2.69 eV in CF. And with the increase of F atoms, the stable structure of graphene is gradually destroyed, the barrier ability of C-atom layer for penetration behaviors of O atoms is greatly reduced. Furthermore, the interfacial adhesion work of pure graphene, CF and C4F films with Cu(111) surfaces were calculated, as well as the electronic structures of the composite interface using first-principles calculations. The interfacial adhesion work of the Cu/G, Cu/C4F and Cu/CF interfaces are 2.626J/m2、3.529J/m2and 3.559J/m2, respectively. The calculations show that the bonding of C4F and C4F with Cu substrate are more strong than pure graphene with Cu substrate, and the interfacial adhesion work increase with increasing of F atom adsorption concentration. The calculation of the density of states also conform stronger interaction between Cu and C atoms of the Cu/C4F interface than that of the Cu/CF interface. Bader charge analysis show increased charge transfer at both the Cu/C4F and Cu/CF interfaces comparing with the Cu/G interface, and Cu/C4F interface has more charge transfer, in which Cu-C bonds are formed.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
物理学报
物理学报 物理-物理:综合
CiteScore
1.70
自引率
30.00%
发文量
31245
审稿时长
1.9 months
期刊介绍: Acta Physica Sinica (Acta Phys. Sin.) is supervised by Chinese Academy of Sciences and sponsored by Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences. Published by Chinese Physical Society and launched in 1933, it is a semimonthly journal with about 40 articles per issue. It publishes original and top quality research papers, rapid communications and reviews in all branches of physics in Chinese. Acta Phys. Sin. enjoys high reputation among Chinese physics journals and plays a key role in bridging China and rest of the world in physics research. Specific areas of interest include: Condensed matter and materials physics; Atomic, molecular, and optical physics; Statistical, nonlinear, and soft matter physics; Plasma physics; Interdisciplinary physics.
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信