{"title":"标准输入CMOS增益级噪声分析","authors":"A. Danchiv, M. Bodea, C. Dan","doi":"10.1109/SMICND.2005.1558804","DOIUrl":null,"url":null,"abstract":"Tins paper presents the systematic first order manual noise analysis for the CMOS active loud standard and folded cascade differential stages and a standard OTA stage. The basic equations for noise performance analysis are developed and the results are checked by SPICE simulation. A standard 0.6 mum CMOS processes is used","PeriodicalId":40779,"journal":{"name":"Teatro e Storia","volume":"1 1","pages":"375-378 vol. 2"},"PeriodicalIF":0.1000,"publicationDate":"2005-12-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Standard input CMOS gain stages noise analysis\",\"authors\":\"A. Danchiv, M. Bodea, C. Dan\",\"doi\":\"10.1109/SMICND.2005.1558804\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Tins paper presents the systematic first order manual noise analysis for the CMOS active loud standard and folded cascade differential stages and a standard OTA stage. The basic equations for noise performance analysis are developed and the results are checked by SPICE simulation. A standard 0.6 mum CMOS processes is used\",\"PeriodicalId\":40779,\"journal\":{\"name\":\"Teatro e Storia\",\"volume\":\"1 1\",\"pages\":\"375-378 vol. 2\"},\"PeriodicalIF\":0.1000,\"publicationDate\":\"2005-12-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Teatro e Storia\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SMICND.2005.1558804\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"0\",\"JCRName\":\"THEATER\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Teatro e Storia","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SMICND.2005.1558804","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"0","JCRName":"THEATER","Score":null,"Total":0}
引用次数: 0
摘要
本文对CMOS有源噪声标准级、折叠级联差动级和标准OTA级进行了系统的一阶人工噪声分析。建立了噪声性能分析的基本方程，并通过SPICE仿真对分析结果进行了验证。使用标准的0.6 μ m CMOS工艺
Tins paper presents the systematic first order manual noise analysis for the CMOS active loud standard and folded cascade differential stages and a standard OTA stage. The basic equations for noise performance analysis are developed and the results are checked by SPICE simulation. A standard 0.6 mum CMOS processes is used
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
