MeF-RAM:一种新型的基于磁电场效应晶体管的非易失性缓存存储器

Shaahin Angizi, N. Khoshavi, A. Marshall, P. Dowben, Deliang Fan
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引用次数: 4

摘要

磁电场效应管(MEFET)是最近发展起来的后cmos场效应管,它为逻辑和存储应用中的高速和低功耗设计提供了有趣的特性。在本文中,我们提出了MeF-RAM,一种基于具有独立读写路径的2-Transistor-1-MEFET (2T1M)存储位单元的非易失性缓存存储器设计。我们表明,通过跨MEFET器件,存储单元电路和阵列架构的适当协同设计,MeF-RAM是快速非易失性存储器(NVM)的有希望的候选者。为了评估MeF-RAM在存储系统中的缓存性能,我们首次构建了一个器件到架构的跨层评估框架,以定量分析和基准测试MeF-RAM设计与其他存储技术,包括易失性存储器(即SRAM, eDRAM)和其他流行的非易失性新兴存储器(即ReRAM, STT-MRAM和SOT-MRAM)。PARSEC基准测试套件的实验结果表明,作为L2高速缓存,MeF-RAM与典型的6T-SRAM和2T1R SOT-MRAM相比,平均降低了约98%和约70%的能量区域延迟(EAT)产品。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
MeF-RAM: A New Non-Volatile Cache Memory Based on Magneto-Electric FET
Magneto-Electric FET (MEFET) is a recently developed post-CMOS FET, which offers intriguing characteristics for high-speed and low-power design in both logic and memory applications. In this article, we present MeF-RAM, a non-volatile cache memory design based on 2-Transistor-1-MEFET (2T1M) memory bit-cell with separate read and write paths. We show that with proper co-design across MEFET device, memory cell circuit, and array architecture, MeF-RAM is a promising candidate for fast non-volatile memory (NVM). To evaluate its cache performance in the memory system, we, for the first time, build a device-to-architecture cross-layer evaluation framework to quantitatively analyze and benchmark the MeF-RAM design with other memory technologies, including both volatile memory (i.e., SRAM, eDRAM) and other popular non-volatile emerging memory (i.e., ReRAM, STT-MRAM, and SOT-MRAM). The experiment results for the PARSEC benchmark suite indicate that, as an L2 cache memory, MeF-RAM reduces Energy Area Latency (EAT) product on average by ~98% and ~70% compared with typical 6T-SRAM and 2T1R SOT-MRAM counterparts, respectively.
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