Gao Jing, Ji-Yin Sun, Y. Chai, Wang Bo, Ling-Jiao Tao, Fei-Hu Bao
{"title":"电磁脉冲作用下RS232接口损坏机理研究","authors":"Gao Jing, Ji-Yin Sun, Y. Chai, Wang Bo, Ling-Jiao Tao, Fei-Hu Bao","doi":"10.1109/CSSE.2008.852","DOIUrl":null,"url":null,"abstract":"RS232 interface executes the role of Transportation and Communication, which has became the important interface between MCU of embedded system and peripheral equipment. Because RS232 mainly work in bottom of communication protocol, so it is important to protect the infrastructure of RS232. In test, pulse double electromagnetic is pulled into RS232 data transmission lines by coupling clamp, simulated differential-mode pulse voltage, basing on the test data, it will get the damaged mechanism of RS232 interface, meanwhile presenting the Logistic model of injected voltage pulse and probability of damage to the port interface, and getting the performance evaluation of RS232 interface, moreover estimating the voltage pulse range of upper and lower bounds at the port in the normal and damage state.","PeriodicalId":6460,"journal":{"name":"2017 14th International Joint Conference on Computer Science and Software Engineering (JCSSE)","volume":"24 1","pages":"1119-1122"},"PeriodicalIF":0.0000,"publicationDate":"2008-12-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Damaged Mechanism Research of RS232 Interface under Electromagnetic Pulse\",\"authors\":\"Gao Jing, Ji-Yin Sun, Y. Chai, Wang Bo, Ling-Jiao Tao, Fei-Hu Bao\",\"doi\":\"10.1109/CSSE.2008.852\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"RS232 interface executes the role of Transportation and Communication, which has became the important interface between MCU of embedded system and peripheral equipment. Because RS232 mainly work in bottom of communication protocol, so it is important to protect the infrastructure of RS232. In test, pulse double electromagnetic is pulled into RS232 data transmission lines by coupling clamp, simulated differential-mode pulse voltage, basing on the test data, it will get the damaged mechanism of RS232 interface, meanwhile presenting the Logistic model of injected voltage pulse and probability of damage to the port interface, and getting the performance evaluation of RS232 interface, moreover estimating the voltage pulse range of upper and lower bounds at the port in the normal and damage state.\",\"PeriodicalId\":6460,\"journal\":{\"name\":\"2017 14th International Joint Conference on Computer Science and Software Engineering (JCSSE)\",\"volume\":\"24 1\",\"pages\":\"1119-1122\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-12-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 14th International Joint Conference on Computer Science and Software Engineering (JCSSE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CSSE.2008.852\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 14th International Joint Conference on Computer Science and Software Engineering (JCSSE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CSSE.2008.852","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Damaged Mechanism Research of RS232 Interface under Electromagnetic Pulse
RS232 interface executes the role of Transportation and Communication, which has became the important interface between MCU of embedded system and peripheral equipment. Because RS232 mainly work in bottom of communication protocol, so it is important to protect the infrastructure of RS232. In test, pulse double electromagnetic is pulled into RS232 data transmission lines by coupling clamp, simulated differential-mode pulse voltage, basing on the test data, it will get the damaged mechanism of RS232 interface, meanwhile presenting the Logistic model of injected voltage pulse and probability of damage to the port interface, and getting the performance evaluation of RS232 interface, moreover estimating the voltage pulse range of upper and lower bounds at the port in the normal and damage state.