{"title":"导电薄膜的无损检测:第十二届世界无损检测会议论文集,阿姆斯特丹(荷兰),1989年4月23-28日,第2卷,第1519-1521页。由J. Boogaard和G.M. van Dijk编辑,爱思唯尔,1989","authors":"V. Gavrilin","doi":"10.1016/0308-9126(90)90937-J","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":100946,"journal":{"name":"NDT International","volume":"12 1","pages":"363"},"PeriodicalIF":0.0000,"publicationDate":"1990-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Non-destructive testing of thin conducting films : Proceedings of the 12th world conference on non-destructive testing, Amsterdam (Netherlands), 23–28 Apr. 1989, Vol. 2, pp. 1519–1521. Edited by J. Boogaard and G.M. van Dijk, Elsevier, 1989\",\"authors\":\"V. Gavrilin\",\"doi\":\"10.1016/0308-9126(90)90937-J\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":100946,\"journal\":{\"name\":\"NDT International\",\"volume\":\"12 1\",\"pages\":\"363\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1990-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"NDT International\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1016/0308-9126(90)90937-J\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"NDT International","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1016/0308-9126(90)90937-J","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Non-destructive testing of thin conducting films : Proceedings of the 12th world conference on non-destructive testing, Amsterdam (Netherlands), 23–28 Apr. 1989, Vol. 2, pp. 1519–1521. Edited by J. Boogaard and G.M. van Dijk, Elsevier, 1989