{"title":"制造后混合信号电路的仿真与故障诊断","authors":"Kyle Pawlowski, Sumit Chkravarty, A. Joginipelly","doi":"10.23919/PanPacific48324.2020.9059414","DOIUrl":null,"url":null,"abstract":"A major problem in circuit board remanufacturing is the identification of parametric faults from age or stress to the individual passive components. We propose a deep machine learning system for simulating and identifying such faults. A simulated dataset is generated for the most common faults in a circuit. This dataset is used to train deep machine learning classification algorithms to identify and classify the faults. The accuracy of system is measured by comparing with real circuit boards in operation.","PeriodicalId":6691,"journal":{"name":"2020 Pan Pacific Microelectronics Symposium (Pan Pacific)","volume":"16 1","pages":"1-6"},"PeriodicalIF":0.0000,"publicationDate":"2020-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Simulation and Fault Diagnosis in Post-Manufacturing Mixed Signal Circuits\",\"authors\":\"Kyle Pawlowski, Sumit Chkravarty, A. Joginipelly\",\"doi\":\"10.23919/PanPacific48324.2020.9059414\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A major problem in circuit board remanufacturing is the identification of parametric faults from age or stress to the individual passive components. We propose a deep machine learning system for simulating and identifying such faults. A simulated dataset is generated for the most common faults in a circuit. This dataset is used to train deep machine learning classification algorithms to identify and classify the faults. The accuracy of system is measured by comparing with real circuit boards in operation.\",\"PeriodicalId\":6691,\"journal\":{\"name\":\"2020 Pan Pacific Microelectronics Symposium (Pan Pacific)\",\"volume\":\"16 1\",\"pages\":\"1-6\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-02-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 Pan Pacific Microelectronics Symposium (Pan Pacific)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.23919/PanPacific48324.2020.9059414\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 Pan Pacific Microelectronics Symposium (Pan Pacific)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/PanPacific48324.2020.9059414","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Simulation and Fault Diagnosis in Post-Manufacturing Mixed Signal Circuits
A major problem in circuit board remanufacturing is the identification of parametric faults from age or stress to the individual passive components. We propose a deep machine learning system for simulating and identifying such faults. A simulated dataset is generated for the most common faults in a circuit. This dataset is used to train deep machine learning classification algorithms to identify and classify the faults. The accuracy of system is measured by comparing with real circuit boards in operation.