{"title":"不完美光子电路中偏置误差的出现","authors":"Fulvio Flamini","doi":"10.1103/PhysRevApplied.16.064038","DOIUrl":null,"url":null,"abstract":"We numerically investigate the impact of imperfections and biased errors in integrated photonic circuits. Our analysis connects and deepens previous studies along the same direction, revealing potential criticalities for high-precision tests and optical implementations of machine learning.","PeriodicalId":6789,"journal":{"name":"2021 Photonics North (PN)","volume":"29 1","pages":"1-1"},"PeriodicalIF":0.0000,"publicationDate":"2021-05-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Emergence of biased errors in imperfect photonic circuits\",\"authors\":\"Fulvio Flamini\",\"doi\":\"10.1103/PhysRevApplied.16.064038\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We numerically investigate the impact of imperfections and biased errors in integrated photonic circuits. Our analysis connects and deepens previous studies along the same direction, revealing potential criticalities for high-precision tests and optical implementations of machine learning.\",\"PeriodicalId\":6789,\"journal\":{\"name\":\"2021 Photonics North (PN)\",\"volume\":\"29 1\",\"pages\":\"1-1\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-05-31\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 Photonics North (PN)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1103/PhysRevApplied.16.064038\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 Photonics North (PN)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1103/PhysRevApplied.16.064038","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Emergence of biased errors in imperfect photonic circuits
We numerically investigate the impact of imperfections and biased errors in integrated photonic circuits. Our analysis connects and deepens previous studies along the same direction, revealing potential criticalities for high-precision tests and optical implementations of machine learning.
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
