关于对向发散磁场下电感耦合等离子体模拟的磁约束效果评估的电子逃逸判定法;关于对向发散磁场下电感耦合等离子体模拟的磁约束效果评估的电子逃逸判定法;Electron Escape for Evaluation of the Magnetic Confinement Effect in Simulations ofInductively Coupled Plasmas under Confronting Divergent Magnetic Fields

{"title":"关于对向发散磁场下电感耦合等离子体模拟的磁约束效果评估的电子逃逸判定法;关于对向发散磁场下电感耦合等离子体模拟的磁约束效果评估的电子逃逸判定法;Electron Escape for Evaluation of the Magnetic Confinement Effect in Simulations ofInductively Coupled Plasmas under Confronting Divergent Magnetic Fields","authors":"Tappei Yamamoto, Hirotake Sugawara","doi":"10.1541/IEEJFMS.137.363","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":23081,"journal":{"name":"The transactions of the Institute of Electrical Engineers of Japan.A","volume":"26 1","pages":"363-364"},"PeriodicalIF":0.0000,"publicationDate":"2017-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"対向発散磁界下誘導結合型プラズマのシミュレーションにおける磁気閉じ込め効果評価のための電子脱出判定法について;対向発散磁界下誘導結合型プラズマのシミュレーションにおける磁気閉じ込め効果評価のための電子脱出判定法について;On Judgement of Electron Escape for Evaluation of the Magnetic Confinement Effect in Simulations of Inductively Coupled Plasmas under Confronting Divergent Magnetic Fields\",\"authors\":\"Tappei Yamamoto, Hirotake Sugawara\",\"doi\":\"10.1541/IEEJFMS.137.363\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":23081,\"journal\":{\"name\":\"The transactions of the Institute of Electrical Engineers of Japan.A\",\"volume\":\"26 1\",\"pages\":\"363-364\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"The transactions of the Institute of Electrical Engineers of Japan.A\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1541/IEEJFMS.137.363\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"The transactions of the Institute of Electrical Engineers of Japan.A","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1541/IEEJFMS.137.363","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}