用飞秒脉冲透射z扫描测量InN外延膜的非线性吸收

2009 Conference on Lasers & Electro Optics & The Pacific Rim Conference on Lasers and Electro-Optics Pub Date : 2009-10-30 DOI:10.1109/CLEOPR.2009.5292609

T. Tsai, Tsung-han Wu, Jung-cheng Liao, T. Wei, H. Chiang, Jih-shang Hwang, D. Tsai, Yang-fang Chen

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引用次数: 0

摘要

采用z -扫描方法研究了720 ~ 790nm范围内InN外延膜的非线性光吸收。计算了InN薄膜的光学吸收截面，结果与带填充模型吻合较好。

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Nonlinear absorption of InN epitaxial films probed by femtosecond pulsed transmission Z-scan measurements

Nonlinear optical absorption of InN epitaxial films in the range of 720-790 nm were investigated by Z-scan measurements. The optical absorption cross-sections of the InN films were estimated, and the values are found in good agreement with band-filling model.

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来源期刊

2009 Conference on Lasers & Electro Optics & The Pacific Rim Conference on Lasers and Electro-Optics

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