用飞秒脉冲透射z扫描测量InN外延膜的非线性吸收

T. Tsai, Tsung-han Wu, Jung-cheng Liao, T. Wei, H. Chiang, Jih-shang Hwang, D. Tsai, Yang-fang Chen
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引用次数: 0

摘要

采用z -扫描方法研究了720 ~ 790nm范围内InN外延膜的非线性光吸收。计算了InN薄膜的光学吸收截面,结果与带填充模型吻合较好。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Nonlinear absorption of InN epitaxial films probed by femtosecond pulsed transmission Z-scan measurements
Nonlinear optical absorption of InN epitaxial films in the range of 720-790 nm were investigated by Z-scan measurements. The optical absorption cross-sections of the InN films were estimated, and the values are found in good agreement with band-filling model.
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