PECVD SiC在MEMS中的耐化学性研究

Hui Guo, Y. Wang, Sheng-mei Chen, Guobing Zhang, Haixia Zhang, Zhihong Li
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引用次数: 10

摘要

碳化硅(SiC)具有优异的电学、力学和化学性能,是在高温、高压或侵蚀等恶劣环境下工作的器件的理想材料。PECVD工艺允许SiC在低温(200℃-400℃)下沉积,这使得SiC在后cmos工艺中具有更好的兼容性。本文对PECVD SiC作为MEMS耐化学腐蚀材料进行了系统的研究。SiC被用作涂层,保护微加工多晶硅器件免受侵蚀环境的影响,并作为湿蚀刻掩膜来图案硅和玻璃。利用碳化硅化学稳定性的优点,也用碳化硅来构建微结构。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
PECVD SiC as a Chemical Resistant Material in MEMS
Silicon carbide (SiC) is a promising material for the device operating in hash environment, such as high temperature, high pressure or erodent environment, owning to its excellent electrical, mechanical, and chemical properties. The PECVD process allows deposition of SiC at low temperature (200degC-400degC), which makes SiC has better compatibility in Post-CMOS processes. In this paper, PECVD SiC has been investigated as a chemical resistant material in MEMS systematically. SiC was utilized as a coating layer to protect micromachined polysilicon devices from erosive environment and as a wet-etch mask to pattern silicon and glass. SiC was also used to construct microstructures taking the merit of SiC's chemical stability.
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