{"title":"变形数字功能验证,以满足混合信号挑战","authors":"Alexandru I. Cianga, Cristian Tepus","doi":"10.1109/SMICND.2014.6966440","DOIUrl":null,"url":null,"abstract":"This paper describes a new structured approach for mixed-signal system simulation. Traditional pre-silicon verification follows two separate tracks: one for analog, another for digital. Our paper shows how to make the two tracks converge. We have integrated analog simulation with digital functional verification. This is the “bridge head” for true mixed-signal pre-silicon verification.","PeriodicalId":6616,"journal":{"name":"2014 International Semiconductor Conference (CAS)","volume":"41 1","pages":"219-222"},"PeriodicalIF":0.0000,"publicationDate":"2014-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Morphing digital functional verification to meet mixed signal challenges\",\"authors\":\"Alexandru I. Cianga, Cristian Tepus\",\"doi\":\"10.1109/SMICND.2014.6966440\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes a new structured approach for mixed-signal system simulation. Traditional pre-silicon verification follows two separate tracks: one for analog, another for digital. Our paper shows how to make the two tracks converge. We have integrated analog simulation with digital functional verification. This is the “bridge head” for true mixed-signal pre-silicon verification.\",\"PeriodicalId\":6616,\"journal\":{\"name\":\"2014 International Semiconductor Conference (CAS)\",\"volume\":\"41 1\",\"pages\":\"219-222\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2014 International Semiconductor Conference (CAS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SMICND.2014.6966440\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 International Semiconductor Conference (CAS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SMICND.2014.6966440","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Morphing digital functional verification to meet mixed signal challenges
This paper describes a new structured approach for mixed-signal system simulation. Traditional pre-silicon verification follows two separate tracks: one for analog, another for digital. Our paper shows how to make the two tracks converge. We have integrated analog simulation with digital functional verification. This is the “bridge head” for true mixed-signal pre-silicon verification.