磁记录用薄膜微结构特征的控制

David E. Laughlin , B. Cheong , Y.C. Feng, D.N. Lambeth , Li-Lien Lee , Bunsen Wong
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引用次数: 25

摘要

作为磁记录介质的磁性薄膜的外磁性能在决定其性能方面起着重要的作用。这些外在性质在很大程度上是由磁性薄膜的微观结构决定的。本文讨论了控制薄膜晶体结构的各种方法。我们首先讨论下层的晶体结构的起源。其次,讨论了磁性薄膜在衬底外延作用下晶体结构的来源。简要介绍了下层和中间层对其他微观组织特征如晶粒尺寸和完美度的控制。包括最近研究的例子。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
The control of microstructural features of thin films for magnetic recording

Extrinsic magnetic properties play a major role in determining the performance of magnetic thin films used as magnetic recording media. These extrinsic properties are the ones which are largely determined by the microstructure of the thin magnetic films. In this paper we discuss various ways that the crystallographic texture of thin films can be controlled. We begin with a discussion of the origin of crystallographic texture of underlayers. Next, the origin of crystallographic texture of magnetic thin films by means of epitaxy with the underlayer is discussed. The control of other microstructural features such as grain size and perfection by means of underlayers and interlayers is briefly introduced. Examples from recent research are included.

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