{"title":"采用柯克帕特里克-贝兹聚焦的高分辨率x射线照相术中的半透明中央光圈","authors":"R. Wilke, M. Vassholz, Tim Salditt","doi":"10.1107/S0108767313019612","DOIUrl":null,"url":null,"abstract":"A semi-transparent central stop has been used for ptychographic coherent diffractive imaging to increase the effective dynamic range in the recording of the far-field diffraction patterns. In this way, the high flux density provided by nano-focusing Kirkpatrick–Baez mirrors can be fully exploited for high resolution and quantitative phase reconstructions.","PeriodicalId":7400,"journal":{"name":"Acta Crystallographica Section A","volume":"21 1","pages":"490 - 497"},"PeriodicalIF":1.8000,"publicationDate":"2013-08-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"47","resultStr":"{\"title\":\"Semi-transparent central stop in high-resolution X-ray ptychography using Kirkpatrick–Baez focusing\",\"authors\":\"R. Wilke, M. Vassholz, Tim Salditt\",\"doi\":\"10.1107/S0108767313019612\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A semi-transparent central stop has been used for ptychographic coherent diffractive imaging to increase the effective dynamic range in the recording of the far-field diffraction patterns. In this way, the high flux density provided by nano-focusing Kirkpatrick–Baez mirrors can be fully exploited for high resolution and quantitative phase reconstructions.\",\"PeriodicalId\":7400,\"journal\":{\"name\":\"Acta Crystallographica Section A\",\"volume\":\"21 1\",\"pages\":\"490 - 497\"},\"PeriodicalIF\":1.8000,\"publicationDate\":\"2013-08-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"47\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Acta Crystallographica Section A\",\"FirstCategoryId\":\"88\",\"ListUrlMain\":\"https://doi.org/10.1107/S0108767313019612\",\"RegionNum\":4,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Acta Crystallographica Section A","FirstCategoryId":"88","ListUrlMain":"https://doi.org/10.1107/S0108767313019612","RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Semi-transparent central stop in high-resolution X-ray ptychography using Kirkpatrick–Baez focusing
A semi-transparent central stop has been used for ptychographic coherent diffractive imaging to increase the effective dynamic range in the recording of the far-field diffraction patterns. In this way, the high flux density provided by nano-focusing Kirkpatrick–Baez mirrors can be fully exploited for high resolution and quantitative phase reconstructions.
期刊介绍:
Acta Crystallographica Section A: Foundations and Advances publishes articles reporting advances in the theory and practice of all areas of crystallography in the broadest sense. As well as traditional crystallography, this includes nanocrystals, metacrystals, amorphous materials, quasicrystals, synchrotron and XFEL studies, coherent scattering, diffraction imaging, time-resolved studies and the structure of strain and defects in materials.
The journal has two parts, a rapid-publication Advances section and the traditional Foundations section. Articles for the Advances section are of particularly high value and impact. They receive expedited treatment and may be highlighted by an accompanying scientific commentary article and a press release. Further details are given in the November 2013 Editorial.
The central themes of the journal are, on the one hand, experimental and theoretical studies of the properties and arrangements of atoms, ions and molecules in condensed matter, periodic, quasiperiodic or amorphous, ideal or real, and, on the other, the theoretical and experimental aspects of the various methods to determine these properties and arrangements.