并发类的覆盖驱动测试代码生成

Valerio Terragni, S. Cheung
{"title":"并发类的覆盖驱动测试代码生成","authors":"Valerio Terragni, S. Cheung","doi":"10.1145/2884781.2884876","DOIUrl":null,"url":null,"abstract":"Previous techniques on concurrency testing have mainly focused on exploring the interleaving space of manually written test code to expose faulty interleavings of shared memory accesses. These techniques assume the availability of failure-inducing tests. In this paper, we present AutoConTest, a coverage-driven approach to generate effective concurrent test code that achieve high interleaving coverage. AutoConTest consists of three components. First, it computes the coverage requirements dynamically and iteratively during sequential test code generation, using a coverage metric that captures the execution context of shared memory accesses. Second, it smartly selects these sequential codes based on the computed result and assembles them for concurrent tests, achieving increased context-sensitive interleaving coverage. Third, it explores the newly covered interleavings. We have implemented AutoConTest as an automated tool and evaluated it using 6 real-world concurrent Java subjects. The results show that AutoConTest is able to generate effective concurrent tests that achieve high interleaving coverage and expose concurrency faults quickly. AutoConTest took less than 65 seconds (including program analysis, test generation and execution) to expose the faults in the program subjects.","PeriodicalId":6485,"journal":{"name":"2016 IEEE/ACM 38th International Conference on Software Engineering (ICSE)","volume":"14 1","pages":"1121-1132"},"PeriodicalIF":0.0000,"publicationDate":"2016-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"21","resultStr":"{\"title\":\"Coverage-Driven Test Code Generation for Concurrent Classes\",\"authors\":\"Valerio Terragni, S. Cheung\",\"doi\":\"10.1145/2884781.2884876\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Previous techniques on concurrency testing have mainly focused on exploring the interleaving space of manually written test code to expose faulty interleavings of shared memory accesses. These techniques assume the availability of failure-inducing tests. In this paper, we present AutoConTest, a coverage-driven approach to generate effective concurrent test code that achieve high interleaving coverage. AutoConTest consists of three components. First, it computes the coverage requirements dynamically and iteratively during sequential test code generation, using a coverage metric that captures the execution context of shared memory accesses. Second, it smartly selects these sequential codes based on the computed result and assembles them for concurrent tests, achieving increased context-sensitive interleaving coverage. Third, it explores the newly covered interleavings. We have implemented AutoConTest as an automated tool and evaluated it using 6 real-world concurrent Java subjects. The results show that AutoConTest is able to generate effective concurrent tests that achieve high interleaving coverage and expose concurrency faults quickly. AutoConTest took less than 65 seconds (including program analysis, test generation and execution) to expose the faults in the program subjects.\",\"PeriodicalId\":6485,\"journal\":{\"name\":\"2016 IEEE/ACM 38th International Conference on Software Engineering (ICSE)\",\"volume\":\"14 1\",\"pages\":\"1121-1132\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-05-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"21\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE/ACM 38th International Conference on Software Engineering (ICSE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/2884781.2884876\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE/ACM 38th International Conference on Software Engineering (ICSE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/2884781.2884876","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 21

摘要

以前的并发测试技术主要集中在探索手工编写的测试代码的交错空间,以暴露共享内存访问的错误交错。这些技术假定有故障诱导测试的可用性。在本文中,我们提出了AutoConTest,这是一种覆盖驱动的方法,可以生成有效的并发测试代码,从而实现高交叉覆盖。AutoConTest由三个部分组成。首先,它在连续的测试代码生成过程中动态地、迭代地计算覆盖率需求,使用捕获共享内存访问的执行上下文的覆盖率度量。其次,它根据计算的结果巧妙地选择这些顺序代码,并将它们组装起来用于并发测试,从而提高了上下文敏感的交错覆盖率。第三,探索新覆盖的交错。我们已经将AutoConTest实现为一个自动化工具,并使用6个真实世界的并发Java主题对其进行了评估。结果表明,AutoConTest能够生成有效的并发测试,实现高交错覆盖率和快速暴露并发错误。AutoConTest在不到65秒的时间内(包括程序分析、测试生成和执行)暴露了程序主体中的错误。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Coverage-Driven Test Code Generation for Concurrent Classes
Previous techniques on concurrency testing have mainly focused on exploring the interleaving space of manually written test code to expose faulty interleavings of shared memory accesses. These techniques assume the availability of failure-inducing tests. In this paper, we present AutoConTest, a coverage-driven approach to generate effective concurrent test code that achieve high interleaving coverage. AutoConTest consists of three components. First, it computes the coverage requirements dynamically and iteratively during sequential test code generation, using a coverage metric that captures the execution context of shared memory accesses. Second, it smartly selects these sequential codes based on the computed result and assembles them for concurrent tests, achieving increased context-sensitive interleaving coverage. Third, it explores the newly covered interleavings. We have implemented AutoConTest as an automated tool and evaluated it using 6 real-world concurrent Java subjects. The results show that AutoConTest is able to generate effective concurrent tests that achieve high interleaving coverage and expose concurrency faults quickly. AutoConTest took less than 65 seconds (including program analysis, test generation and execution) to expose the faults in the program subjects.
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