研究了烧结ZnO非线性电阻器的微观结构和密度

Chuntian Chen, Haifeng Xiao, J. Zou, Ru Wang, Hanfei Zhu, Xianyou Zhang
{"title":"研究了烧结ZnO非线性电阻器的微观结构和密度","authors":"Chuntian Chen, Haifeng Xiao, J. Zou, Ru Wang, Hanfei Zhu, Xianyou Zhang","doi":"10.1109/CEIDP.2011.6232624","DOIUrl":null,"url":null,"abstract":"Systematic researched have been made of the grain growth and density of sintered ZnO-based systems containing one or more additive oxides of the type Bi2O3, MnO2, and CoO. These samples were characterized using such techniques as scanning electron microscopy. The influence of the nature and amount of additive oxides and sintering temperature at 950 to 1350°C is discussed in relation to microstructure, breakdown voltage and the density present.","PeriodicalId":6317,"journal":{"name":"2011 Annual Report Conference on Electrical Insulation and Dielectric Phenomena","volume":"1 1","pages":"161-163"},"PeriodicalIF":0.0000,"publicationDate":"2011-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Researched on microstructure and density of sintered ZnO non-linear resistors\",\"authors\":\"Chuntian Chen, Haifeng Xiao, J. Zou, Ru Wang, Hanfei Zhu, Xianyou Zhang\",\"doi\":\"10.1109/CEIDP.2011.6232624\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Systematic researched have been made of the grain growth and density of sintered ZnO-based systems containing one or more additive oxides of the type Bi2O3, MnO2, and CoO. These samples were characterized using such techniques as scanning electron microscopy. The influence of the nature and amount of additive oxides and sintering temperature at 950 to 1350°C is discussed in relation to microstructure, breakdown voltage and the density present.\",\"PeriodicalId\":6317,\"journal\":{\"name\":\"2011 Annual Report Conference on Electrical Insulation and Dielectric Phenomena\",\"volume\":\"1 1\",\"pages\":\"161-163\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 Annual Report Conference on Electrical Insulation and Dielectric Phenomena\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CEIDP.2011.6232624\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 Annual Report Conference on Electrical Insulation and Dielectric Phenomena","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CEIDP.2011.6232624","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

对含有Bi2O3、MnO2和CoO等一种或多种氧化物的烧结zno基体系的晶粒生长和密度进行了系统的研究。这些样品用扫描电子显微镜等技术进行了表征。讨论了氧化物添加剂的性质和用量以及烧结温度(950 ~ 1350℃)对微观组织、击穿电压和密度的影响。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Researched on microstructure and density of sintered ZnO non-linear resistors
Systematic researched have been made of the grain growth and density of sintered ZnO-based systems containing one or more additive oxides of the type Bi2O3, MnO2, and CoO. These samples were characterized using such techniques as scanning electron microscopy. The influence of the nature and amount of additive oxides and sintering temperature at 950 to 1350°C is discussed in relation to microstructure, breakdown voltage and the density present.
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