有光照和无光照条件下锑化铟半导体中瞬态辐射过量载流子寿命和载流子密度的时间依赖性

Getu Endale
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引用次数: 0

摘要

在这项工作中,我们模拟了直接带隙半导体锑化铟(Insb)在照明和关闭照明后的光产生和瞬态辐射复合过量载流子寿命。过量载流子密度和过量载流子寿命的时间依赖性由掺杂水平1017cm-3和吸收率1:21 × 1024cm-3s-1确定。确定了每个多余载流子寿命达到其稳态值和多余载流子寿命的瞬态平均时间。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Time Dependence of Transient Radiative Excess Carrier Lifetimes and Carriers Density in Indium Antimonide(InSb) Semiconductor in the Presence and Absence of Illumination
In this work, we models the optical generation and transient radiative recombination excess carrier lifetimes in direct band gap semiconductors Indium antimonide (Insb) during illumination and after switching off the illumination. The time dependence of excess carrier density and excess carrier lifetimes are determined by using the doping level 1017cm-3 and absorption rate 1:21x1024cm-3s-1. The transient mean times for each excess carrier lifetimes to reach their steady-state values and excess carrier lifetime are determined.
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