内存泄漏检测运行时服务,用于嵌入式Linux设备

R. Beneder, Bernd Glatz, M. Horauer, T. Rauscher
{"title":"内存泄漏检测运行时服务,用于嵌入式Linux设备","authors":"R. Beneder, Bernd Glatz, M. Horauer, T. Rauscher","doi":"10.1109/ETFA.2014.7005223","DOIUrl":null,"url":null,"abstract":"In practice, software is often deployed with several hidden bugs despite various test processes and static analyses. Such bugs often cause a phenomenon called software aging that refers to the accumulation of errors occurring in long running software systems that results in a decrease of performance and an increases of the probability to crash the entire system. This paper presents a mechanism to detect memory leaks in embedded systems software at runtime that can be used to counter software aging. In particular, it presents and compares two measurement based algorithms to identify memory leaks on Embedded Linux devices at runtime. Both algorithms have been implemented and evaluated using an industrial room controller targeting building automation. Based on this approach we were able to identify an existing memory leak we were unaware of beforehand.","PeriodicalId":20477,"journal":{"name":"Proceedings of the 2014 IEEE Emerging Technology and Factory Automation (ETFA)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2014-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Memory leak detection runtime-service for embedded Linux devices\",\"authors\":\"R. Beneder, Bernd Glatz, M. Horauer, T. Rauscher\",\"doi\":\"10.1109/ETFA.2014.7005223\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In practice, software is often deployed with several hidden bugs despite various test processes and static analyses. Such bugs often cause a phenomenon called software aging that refers to the accumulation of errors occurring in long running software systems that results in a decrease of performance and an increases of the probability to crash the entire system. This paper presents a mechanism to detect memory leaks in embedded systems software at runtime that can be used to counter software aging. In particular, it presents and compares two measurement based algorithms to identify memory leaks on Embedded Linux devices at runtime. Both algorithms have been implemented and evaluated using an industrial room controller targeting building automation. Based on this approach we were able to identify an existing memory leak we were unaware of beforehand.\",\"PeriodicalId\":20477,\"journal\":{\"name\":\"Proceedings of the 2014 IEEE Emerging Technology and Factory Automation (ETFA)\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 2014 IEEE Emerging Technology and Factory Automation (ETFA)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ETFA.2014.7005223\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 2014 IEEE Emerging Technology and Factory Automation (ETFA)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ETFA.2014.7005223","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

摘要

在实践中,尽管有各种各样的测试过程和静态分析,软件部署时经常会有几个隐藏的bug。这类bug通常会导致一种叫做软件老化的现象,它指的是在长时间运行的软件系统中出现的错误的积累,从而导致性能下降和整个系统崩溃的可能性增加。本文提出了一种在运行时检测嵌入式系统软件内存泄漏的机制,该机制可用于对抗软件老化。特别地,它提出并比较了两种基于度量的算法,用于在运行时识别嵌入式Linux设备上的内存泄漏。这两种算法都在一个以楼宇自动化为目标的工业房间控制器上实现和评估。基于这种方法,我们能够识别我们之前没有意识到的现有内存泄漏。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Memory leak detection runtime-service for embedded Linux devices
In practice, software is often deployed with several hidden bugs despite various test processes and static analyses. Such bugs often cause a phenomenon called software aging that refers to the accumulation of errors occurring in long running software systems that results in a decrease of performance and an increases of the probability to crash the entire system. This paper presents a mechanism to detect memory leaks in embedded systems software at runtime that can be used to counter software aging. In particular, it presents and compares two measurement based algorithms to identify memory leaks on Embedded Linux devices at runtime. Both algorithms have been implemented and evaluated using an industrial room controller targeting building automation. Based on this approach we were able to identify an existing memory leak we were unaware of beforehand.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信