高zn浓度Cd1−xZnxTe厚膜的结构和光学性质

2017 IEEE 7th International Conference Nanomaterials: Application & Properties (NAP) Pub Date : 2017-09-01 DOI:10.1109/NAP.2017.8190350

Y. Znamenshchykov, V. Kosyak, A. Opanasyuk, M. Kolesnyk, P. Fochuk, A. Cerskus

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引用次数: 3

摘要

采用真空升华法制备了厚的Cd1−xZnxTe多晶薄膜。利用x射线衍射、拉曼光谱和低温光致发光技术对其结构和光学性质进行了研究。得到的结果可以估计薄膜的相组成，并计算薄膜的带隙值，当x=0.48和x=0.65时，膜的带隙分别为1.97 eV和2.13 eV。

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Structural and optical properties of Cd1−xZnxTe thick films with high zn concentrations

Thick polycrystalline Cd1−xZnxTe films were deposited by the close spaced vacuum sublimation method. Study of structural and optical properties was carried out by X-ray diffraction, Raman spectroscopy, and low temperature photoluminescence. Obtained results allowed to estimate phase composition of the films, as well as to calculate the values of band gap of the films, which was 1.97 eV and 2.13 eV for samples with x=0.48 and x=0.65 respectively.

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2017 IEEE 7th International Conference Nanomaterials: Application & Properties (NAP)

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