用积分方程模拟薄导体的电阻率和激电异常

L. Eskola, H. Soininen, M. Oksama
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引用次数: 8

摘要

提出了一种计算薄导体电阻率和激电异常的方法。导体由二维导电表面表示,因此其边界上的电荷可以描述为二维表面电荷。用积分微分方程求解表面上的势。对于表面的中等电导率值,同样的公式也可用于计算导体外的电势。然而,对于高导电性,导体上的电荷密度首先借助于库仑定律求解,其中电势作为主要项。然后通过再次应用库仑定律,从已知的电荷密度计算出导体外的电势。这个程序在整个电导率范围内是有效的,从零到几乎无限的值。对于完美导体,也可以通过应用导体的等势条件直接计算出其电势。作为一种应用,该模型的电位和电荷分布被认为是导体纵向电导的函数。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Modelling of resistivity and IP anomalies of a thin conductor with an integral equation

A method is presented for calculating the resistivity and IP anomalies of a thin conductor. The conductor is represented by a two-dimensional conductive surface, and consequently the electric charge on its boundaries can be described as a two-dimensional surface charge.

The potential on the surface is solved from an integrodifferential equation. For moderate conductivity values of the surface, the same equation can also be used in calculating the potential outside the conductor. For high conductivity, however, the charge density on the conductor is first solved with the aid of Coulomb's law, where the potential acts as primary term. The potential outside the conductor is then calculated from the known charge density by again applying the Coulomb's law. This procedure is valid over the whole conductivity range from zero to practically infinite values. For a perfect conductor, the potential can also be calculated directly by applying the equipotential condition of the conductor.

As an application, the potential and charge distributions of the model are considered as a function of the longitudinal conductance of the conductor.

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