{"title":"同步加速器x射线地形学","authors":"B.K. Tanner, D.K. Bowen","doi":"10.1016/0920-2307(92)90002-I","DOIUrl":null,"url":null,"abstract":"<div><p>The application of synchrotron radiation for X-ray topography is reviewed. For two types of experiment, dynamic studies and statistical surveys, the intensity and continuous spectrum of synchrotron radiation is particularly important but it is shown that the time structure and polarisation can also be exploited. The future potential of the technique is discussed.</p></div>","PeriodicalId":100891,"journal":{"name":"Materials Science Reports","volume":"8 8","pages":"Pages 371-407"},"PeriodicalIF":0.0000,"publicationDate":"1992-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0920-2307(92)90002-I","citationCount":"23","resultStr":"{\"title\":\"Synchrotron X-radiation topography\",\"authors\":\"B.K. Tanner, D.K. Bowen\",\"doi\":\"10.1016/0920-2307(92)90002-I\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>The application of synchrotron radiation for X-ray topography is reviewed. For two types of experiment, dynamic studies and statistical surveys, the intensity and continuous spectrum of synchrotron radiation is particularly important but it is shown that the time structure and polarisation can also be exploited. The future potential of the technique is discussed.</p></div>\",\"PeriodicalId\":100891,\"journal\":{\"name\":\"Materials Science Reports\",\"volume\":\"8 8\",\"pages\":\"Pages 371-407\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://sci-hub-pdf.com/10.1016/0920-2307(92)90002-I\",\"citationCount\":\"23\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Materials Science Reports\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/092023079290002I\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Materials Science Reports","FirstCategoryId":"1085","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/092023079290002I","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The application of synchrotron radiation for X-ray topography is reviewed. For two types of experiment, dynamic studies and statistical surveys, the intensity and continuous spectrum of synchrotron radiation is particularly important but it is shown that the time structure and polarisation can also be exploited. The future potential of the technique is discussed.
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