J. Kroll, P. Allport, A. Chisholm, V. Fadeyev, W. George, L. Gonella, I. Kopsalis, J. Kvasnička, V. Latonova, J. Lomas, F. Martinez-McKinney, M. Mikestikova, X. Shi, P. Tůma, M. Ullán, Y. Unno
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Effect of irradiation and annealing performed with bias voltage applied across the coupling capacitors on the interstrip resistance of ATLAS ITk silicon strip sensors