使用容错技术的缓存电压缩放限制

Avesta Sasan, A. Djahromi, A. Eltawil, F. Kurdahi
{"title":"使用容错技术的缓存电压缩放限制","authors":"Avesta Sasan, A. Djahromi, A. Eltawil, F. Kurdahi","doi":"10.1109/ICCD.2007.4601943","DOIUrl":null,"url":null,"abstract":"This paper proposes a new low power cache architecture that utilizes fault tolerance to allow aggressively reduced voltage levels. The fault tolerant overhead circuits consume little energy, but enable the system to operate correctly and boost the system performance to close to defect free operation. Overall, power savings of over 40% are reported on standard benchmarks.","PeriodicalId":6306,"journal":{"name":"2007 25th International Conference on Computer Design","volume":"92 1","pages":"488-495"},"PeriodicalIF":0.0000,"publicationDate":"2007-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"25","resultStr":"{\"title\":\"Limits on voltage scaling for caches utilizing fault tolerant techniques\",\"authors\":\"Avesta Sasan, A. Djahromi, A. Eltawil, F. Kurdahi\",\"doi\":\"10.1109/ICCD.2007.4601943\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper proposes a new low power cache architecture that utilizes fault tolerance to allow aggressively reduced voltage levels. The fault tolerant overhead circuits consume little energy, but enable the system to operate correctly and boost the system performance to close to defect free operation. Overall, power savings of over 40% are reported on standard benchmarks.\",\"PeriodicalId\":6306,\"journal\":{\"name\":\"2007 25th International Conference on Computer Design\",\"volume\":\"92 1\",\"pages\":\"488-495\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"25\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 25th International Conference on Computer Design\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICCD.2007.4601943\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 25th International Conference on Computer Design","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCD.2007.4601943","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 25

摘要

本文提出了一种新的低功耗缓存架构,该架构利用容错能力来大幅降低电压水平。容错架空电路耗能小,但能使系统正常运行,提高系统性能,接近无缺陷运行。总体而言,在标准基准测试中报告的节电超过40%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Limits on voltage scaling for caches utilizing fault tolerant techniques
This paper proposes a new low power cache architecture that utilizes fault tolerance to allow aggressively reduced voltage levels. The fault tolerant overhead circuits consume little energy, but enable the system to operate correctly and boost the system performance to close to defect free operation. Overall, power savings of over 40% are reported on standard benchmarks.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信