{"title":"利用Kohn-Sham密度泛函理论计算电子结构中的构型力","authors":"P. Motamarri, V. Gavini","doi":"10.1103/PhysRevB.97.165132","DOIUrl":null,"url":null,"abstract":"We derive the expressions for configurational forces in Kohn-Sham density functional theory, which correspond to the generalized variational force computed as the derivative of the Kohn-Sham energy functional with respect to the position of a material point $\\textbf{x}$. These configurational forces that result from the inner variations of the Kohn-Sham energy functional provide a unified framework to compute atomic forces as well as stress tensor for geometry optimization. Importantly, owing to the variational nature of the formulation, these configurational forces inherently account for the Pulay corrections. The formulation presented in this work treats both pseudopotential and all-electron calculations in single framework, and employs a local variational real-space formulation of Kohn-Sham DFT expressed in terms of the non-orthogonal wavefunctions that is amenable to reduced-order scaling techniques. We demonstrate the accuracy and performance of the proposed configurational force approach on benchmark all-electron and pseudopotential calculations conducted using higher-order finite-element discretization. To this end, we examine the rates of convergence of the finite-element discretization in the computed forces and stresses for various materials systems, and, further, verify the accuracy from finite-differencing the energy. Wherever applicable, we also compare the forces and stresses with those obtained from Kohn-Sham DFT calculations employing plane-wave basis (pseudopotential calculations) and Gaussian basis (all-electron calculations). Finally, we verify the accuracy of the forces on large materials systems involving a metallic aluminum nanocluster containing 666 atoms and an alkane chain containing 902 atoms, where the Kohn-Sham electronic ground state is computed using a reduced-order scaling subspace projection technique (P. Motamarri and V. Gavini, Phys. Rev. B 90, 115127).","PeriodicalId":8424,"journal":{"name":"arXiv: Computational Physics","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2017-12-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"14","resultStr":"{\"title\":\"Configurational forces in electronic structure calculations using Kohn-Sham density functional theory\",\"authors\":\"P. Motamarri, V. Gavini\",\"doi\":\"10.1103/PhysRevB.97.165132\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We derive the expressions for configurational forces in Kohn-Sham density functional theory, which correspond to the generalized variational force computed as the derivative of the Kohn-Sham energy functional with respect to the position of a material point $\\\\textbf{x}$. These configurational forces that result from the inner variations of the Kohn-Sham energy functional provide a unified framework to compute atomic forces as well as stress tensor for geometry optimization. Importantly, owing to the variational nature of the formulation, these configurational forces inherently account for the Pulay corrections. The formulation presented in this work treats both pseudopotential and all-electron calculations in single framework, and employs a local variational real-space formulation of Kohn-Sham DFT expressed in terms of the non-orthogonal wavefunctions that is amenable to reduced-order scaling techniques. We demonstrate the accuracy and performance of the proposed configurational force approach on benchmark all-electron and pseudopotential calculations conducted using higher-order finite-element discretization. To this end, we examine the rates of convergence of the finite-element discretization in the computed forces and stresses for various materials systems, and, further, verify the accuracy from finite-differencing the energy. Wherever applicable, we also compare the forces and stresses with those obtained from Kohn-Sham DFT calculations employing plane-wave basis (pseudopotential calculations) and Gaussian basis (all-electron calculations). Finally, we verify the accuracy of the forces on large materials systems involving a metallic aluminum nanocluster containing 666 atoms and an alkane chain containing 902 atoms, where the Kohn-Sham electronic ground state is computed using a reduced-order scaling subspace projection technique (P. Motamarri and V. Gavini, Phys. Rev. B 90, 115127).\",\"PeriodicalId\":8424,\"journal\":{\"name\":\"arXiv: Computational Physics\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-12-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"14\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"arXiv: Computational Physics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1103/PhysRevB.97.165132\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"arXiv: Computational Physics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1103/PhysRevB.97.165132","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 14
摘要
我们导出了Kohn-Sham密度泛函理论中构型力的表达式,它对应于作为Kohn-Sham能量泛函关于物质点位置的导数计算的广义变分力$\textbf{x}$。这些由Kohn-Sham能量泛函的内部变化产生的构型力为计算原子力以及用于几何优化的应力张量提供了一个统一的框架。重要的是,由于公式的变分性质,这些构形力固有地解释了普拉伊修正。在这项工作中提出的公式在单一框架中处理伪势和全电子计算,并采用局部变分的Kohn-Sham DFT的实空间公式,该公式用非正交波函数表示,适用于降阶标度技术。我们在使用高阶有限元离散化进行的基准全电子和伪势计算中证明了所提出的构形力方法的准确性和性能。为此,我们研究了各种材料系统计算力和应力的有限元离散化的收敛速度,并进一步验证了有限差分能量的准确性。在适用的情况下,我们还将力和应力与采用平面波基(伪势计算)和高斯基(全电子计算)的Kohn-Sham DFT计算得到的力和应力进行了比较。最后,我们验证了在包含666个原子的金属铝纳米团簇和包含902个原子的烷烃链的大型材料系统上的力的准确性,其中使用降阶缩放子空间投影技术计算了Kohn-Sham电子基态(P. Motamarri和V. Gavini, Phys)。Rev. B 90,115127)。
Configurational forces in electronic structure calculations using Kohn-Sham density functional theory
We derive the expressions for configurational forces in Kohn-Sham density functional theory, which correspond to the generalized variational force computed as the derivative of the Kohn-Sham energy functional with respect to the position of a material point $\textbf{x}$. These configurational forces that result from the inner variations of the Kohn-Sham energy functional provide a unified framework to compute atomic forces as well as stress tensor for geometry optimization. Importantly, owing to the variational nature of the formulation, these configurational forces inherently account for the Pulay corrections. The formulation presented in this work treats both pseudopotential and all-electron calculations in single framework, and employs a local variational real-space formulation of Kohn-Sham DFT expressed in terms of the non-orthogonal wavefunctions that is amenable to reduced-order scaling techniques. We demonstrate the accuracy and performance of the proposed configurational force approach on benchmark all-electron and pseudopotential calculations conducted using higher-order finite-element discretization. To this end, we examine the rates of convergence of the finite-element discretization in the computed forces and stresses for various materials systems, and, further, verify the accuracy from finite-differencing the energy. Wherever applicable, we also compare the forces and stresses with those obtained from Kohn-Sham DFT calculations employing plane-wave basis (pseudopotential calculations) and Gaussian basis (all-electron calculations). Finally, we verify the accuracy of the forces on large materials systems involving a metallic aluminum nanocluster containing 666 atoms and an alkane chain containing 902 atoms, where the Kohn-Sham electronic ground state is computed using a reduced-order scaling subspace projection technique (P. Motamarri and V. Gavini, Phys. Rev. B 90, 115127).