基于遗传算法的带外部参数集成光幕阵列优化方法

Rui Chen, Bowen Ji, Ding Chen, C. Duan
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引用次数: 1

摘要

光屏阵列测量原理具有灵敏度高、响应速度快的特点,适用于包括弹丸在内的小、快目标的动态参数测量。由于光幕阵列的空间结构决定了测量精度,因此通常对光幕之间的角度等内部参数进行校准,然后直接用于现场。然而,在测试现场,测量状态的影响被忽略了。本文以集成光屏阵列天空垂直目标为研究对象,引入两个旋转角度作为外部参数来描述目标标定状态与测量状态之间的偏差,从而对测量模型进行优化。针对外部参数无法直接测量的问题,在复杂工程模型下,设计了一种基于遗传算法的机器学习外部参数反演方法。在机器学习过程中,利用弹孔与光幕阵列测量坐标之间的偏差建立遗传算法的反演数据库。仿真和实弹试验表明,本文提出的优化方法和参数辨识算法可以直接优化光幕阵列原理的测量模型,提高测量精度,也可以为其他工程问题的优化和参数辨识提供参考。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Optimization Method of Integrated Light-Screen Array with External Parameters Based on Genetic Algorithm
Due to the high sensitivity and fast response, the light-screen array measurement principle is suitable for the dynamic parameter measurement of small and fast targets including projectile. Since the spatial structures of the light-screen array determine the measurement accuracy, internal parameters such as the angles between the light-screens are usually calibrated and then directly used in the field. However, the effect of the measuring state is ignored in the test field. This paper takes the integrated light-screen array sky vertical target as the research object, and two rotation angles are introduced as external parameters to describe the deviation between the calibration state and measuring state of the target, so as to optimize the measurement model. Aiming at the problem that the external parameters cannot be measured directly, an external parameter inversion method of machine learning based on a genetic algorithm is designed under a complex engineering model. The deviation between the projectile hole and the light-screen array measurement coordinates is used to build an inversion database for the genetic algorithm during the machine learning process. The simulation and the live firing test show that the optimization method and parameter identification algorithm in this paper can optimize the measurement model and improve the measurement accuracy of the light-screen array principle directly and can also provide a reference for the optimization and parameter identification in other engineering problems.
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