光伏逆变器电力电子元件可靠性研究进展

Mohd. Shahzad, K. Bharath, Mohammed Ali Khan, A. Haque
{"title":"光伏逆变器电力电子元件可靠性研究进展","authors":"Mohd. Shahzad, K. Bharath, Mohammed Ali Khan, A. Haque","doi":"10.1109/ICPECA47973.2019.8975585","DOIUrl":null,"url":null,"abstract":"This paper focuses on the topic of reliability analysis and lifetime evaluations for various power electronic components in a photovoltaic (PV) inverter. The basic indices used in reliability from the mathematical and customers’ points of view are discussed. The most critical components like insulated gate bipolar transistors (IGBT), metal oxide semiconductor field effect transistor (MOSFET), heatsinks and capacitors, which contributes in failure are identified and the mathematical indices are used to evaluate the reliability of hese components. In addition, this review identifies the failures and their causes for various components, providing an insight for keys aspects of performance enhancement. Further, different methods used for analyzing the performance and reliability are discussed for better understanding.","PeriodicalId":6761,"journal":{"name":"2019 International Conference on Power Electronics, Control and Automation (ICPECA)","volume":"48 1","pages":"1-6"},"PeriodicalIF":0.0000,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Review on Reliability of Power Electronic Components in Photovoltaic Inverters\",\"authors\":\"Mohd. Shahzad, K. Bharath, Mohammed Ali Khan, A. Haque\",\"doi\":\"10.1109/ICPECA47973.2019.8975585\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper focuses on the topic of reliability analysis and lifetime evaluations for various power electronic components in a photovoltaic (PV) inverter. The basic indices used in reliability from the mathematical and customers’ points of view are discussed. The most critical components like insulated gate bipolar transistors (IGBT), metal oxide semiconductor field effect transistor (MOSFET), heatsinks and capacitors, which contributes in failure are identified and the mathematical indices are used to evaluate the reliability of hese components. In addition, this review identifies the failures and their causes for various components, providing an insight for keys aspects of performance enhancement. Further, different methods used for analyzing the performance and reliability are discussed for better understanding.\",\"PeriodicalId\":6761,\"journal\":{\"name\":\"2019 International Conference on Power Electronics, Control and Automation (ICPECA)\",\"volume\":\"48 1\",\"pages\":\"1-6\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 International Conference on Power Electronics, Control and Automation (ICPECA)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICPECA47973.2019.8975585\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 International Conference on Power Electronics, Control and Automation (ICPECA)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICPECA47973.2019.8975585","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5

摘要

本文主要研究了光伏逆变器中各种电力电子元件的可靠性分析和寿命评估。从数学和用户的角度讨论了可靠性的基本指标。确定了导致故障的最关键器件,如绝缘栅双极晶体管(IGBT)、金属氧化物半导体场效应晶体管(MOSFET)、散热器和电容器,并使用数学指标来评估这些器件的可靠性。此外,本文还将确定各种组件的故障及其原因,从而深入了解性能增强的关键方面。此外,还讨论了用于分析性能和可靠性的不同方法,以便更好地理解。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Review on Reliability of Power Electronic Components in Photovoltaic Inverters
This paper focuses on the topic of reliability analysis and lifetime evaluations for various power electronic components in a photovoltaic (PV) inverter. The basic indices used in reliability from the mathematical and customers’ points of view are discussed. The most critical components like insulated gate bipolar transistors (IGBT), metal oxide semiconductor field effect transistor (MOSFET), heatsinks and capacitors, which contributes in failure are identified and the mathematical indices are used to evaluate the reliability of hese components. In addition, this review identifies the failures and their causes for various components, providing an insight for keys aspects of performance enhancement. Further, different methods used for analyzing the performance and reliability are discussed for better understanding.
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