用场效应晶体管探测单个细胞的粘附和活力

TRANSDUCERS 2007 - 2007 International Solid-State Sensors, Actuators and Microsystems Conference Pub Date : 2007-06-10 DOI:10.1109/SENSOR.2007.4300252

S. Ingebrandt, G. Wrobel, S. Eick, S. Schafer, A. Offenhausser

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引用次数: 4

摘要

我们描述了一种非侵入性的电子监测细胞-基质粘附的新方法。我们使用开门场效应晶体管(FET)芯片进行粘附测量。这些芯片是开发、制造的，以前用于电致细胞的细胞外记录。我们开发了一种小型便携式16通道放大器系统，用于监测场效应管的电子传递函数。我们提出了HEK 293细胞在单个细胞水平上的细胞粘附测量。该系统还可以用于探测单个细胞的生存能力。

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Probing the Adhesion and Viability of Individual Cells with Field-Effect Transistors

We describe a novel method for the non-invasive, electronic monitoring of the cell-substrate adhesion. We utilize open-gate field-effect transistor (FET) chips for our adhesion measurements. These chips were developed, fabricated, and previously used for the extracellular recording from electrogenic cells. We developed a miniaturized and portable 16-channel amplifier system, which monitors the electronic transfer function of the FETs. We present cellular adhesion measurements of HEK 293 cells on an individual cell level. The system can additionally be used to probe the viability of individual cells.

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TRANSDUCERS 2007 - 2007 International Solid-State Sensors, Actuators and Microsystems Conference

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