W. Benzing, M. Biehl, E. Crocoll, R. Koch, M. Neuhaus, T. Scherer, W. Jutzi
{"title":"实时测量的四级rsfq计数器与Nb-Al2O3-Nb约瑟夫森结","authors":"W. Benzing, M. Biehl, E. Crocoll, R. Koch, M. Neuhaus, T. Scherer, W. Jutzi","doi":"10.1016/S0964-1807(99)00011-3","DOIUrl":null,"url":null,"abstract":"<div><p>RSFQ-toggle-flipflops with a SFQ-trigger circuit a Josephson transmission line at the input and a SFQ/dc-circuit at the output of each stage are implemented in the Nb–Al<sub>2</sub>O<sub>3</sub><span>–Nb Josephson junction<span> technology on a single chip having coplanar wave guides at input and output. The counter is tested successfully at 4.2</span></span> <span>K via coplanar/coaxial transitions using a bit pattern generator<span> and a digital oscilloscope at room temperature up to </span></span><em>f</em><sub>I</sub>≈2<!--> <span>GHz pulse repetition frequency at the input. The highest test frequency </span><em>f</em><sub>I</sub> is limited by the available pattern generator.</p></div>","PeriodicalId":100110,"journal":{"name":"Applied Superconductivity","volume":"6 10","pages":"Pages 553-557"},"PeriodicalIF":0.0000,"publicationDate":"1999-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/S0964-1807(99)00011-3","citationCount":"1","resultStr":"{\"title\":\"Real-time measurements on a four stage RSFQ-counter with Nb–Al2O3–Nb Josephson junctions\",\"authors\":\"W. Benzing, M. Biehl, E. Crocoll, R. Koch, M. Neuhaus, T. Scherer, W. Jutzi\",\"doi\":\"10.1016/S0964-1807(99)00011-3\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>RSFQ-toggle-flipflops with a SFQ-trigger circuit a Josephson transmission line at the input and a SFQ/dc-circuit at the output of each stage are implemented in the Nb–Al<sub>2</sub>O<sub>3</sub><span>–Nb Josephson junction<span> technology on a single chip having coplanar wave guides at input and output. The counter is tested successfully at 4.2</span></span> <span>K via coplanar/coaxial transitions using a bit pattern generator<span> and a digital oscilloscope at room temperature up to </span></span><em>f</em><sub>I</sub>≈2<!--> <span>GHz pulse repetition frequency at the input. The highest test frequency </span><em>f</em><sub>I</sub> is limited by the available pattern generator.</p></div>\",\"PeriodicalId\":100110,\"journal\":{\"name\":\"Applied Superconductivity\",\"volume\":\"6 10\",\"pages\":\"Pages 553-557\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1999-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://sci-hub-pdf.com/10.1016/S0964-1807(99)00011-3\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Applied Superconductivity\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0964180799000113\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Applied Superconductivity","FirstCategoryId":"1085","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0964180799000113","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Real-time measurements on a four stage RSFQ-counter with Nb–Al2O3–Nb Josephson junctions
RSFQ-toggle-flipflops with a SFQ-trigger circuit a Josephson transmission line at the input and a SFQ/dc-circuit at the output of each stage are implemented in the Nb–Al2O3–Nb Josephson junction technology on a single chip having coplanar wave guides at input and output. The counter is tested successfully at 4.2K via coplanar/coaxial transitions using a bit pattern generator and a digital oscilloscope at room temperature up to fI≈2 GHz pulse repetition frequency at the input. The highest test frequency fI is limited by the available pattern generator.
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