一种新型低成本、高性能、可靠的硅中间体

F. Yazdani
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引用次数: 3

摘要

硅中间层已成为集成细间距、高密度器件的衬底选择。2.5D/3D器件的传统封装涉及多个级别的组件。通常,2.5D/3D器件首先在宽高比为10:100的薄硅中间层上组装,然后在多层有机堆积衬底上进行第二级组装。在本研究中,我们介绍了在PCB上直接组装硅中间层,从而降低了成本并提高了2.5D/3D应用以及晶圆级扇出应用的性能。研究了在PCB上直接组装硅中间层时,欠填充对焊点可靠性的影响。在310um厚的刚性硅衬底上设计并制造了10×10mm2中间体试验车。中间板侧面的BGA通过回流过程与共晶焊料球碰撞。然后通过回流工艺将中间层组装在50×50mm2 FR-4 PCB上。我们介绍了成本分析,设计流程,以及在PCB上直接组装刚性硅中间层。在250、500、750和1000间隔的温度循环中,利用CSAM图像证明了欠填充对焊点可靠性的影响。结果表明,所有试样均成功通过了温度循环应力试验。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A novel low cost, high performance and reliable silicon interposer
Silicon interposer has emerged as a substrate of choice for integrating fine pitch, high density devices. Conventional packaging of 2.5D/3D devices involves multiple level of assemblies. Normally, 2.5D/3D devices are first assembled on thinned silicon interposer with aspect ratio of 10:100 followed by second level assembly on a multi-layer organic build-up substrate. In this study we introduce direct assembly of silicon interposer on PCB, resulting in reduced cost and increased performance for 2.5D/3D applications as well as wafer-level fan-out applications. We investigate effect of under-fill on solder joint reliability during direct assembly of silicon interposer on PCB. A 10×10mm2 interposer test vehicle was designed and fabricated on 310um thick rigid silicon substrate. BGA of side of the interposer was bumped with eutectic solder balls through a reflow process. Interposer was then assembled on a 50×50mm2 FR-4 PCB through a reflow process. We present cost analysis, design flow, and direct assembly of rigid silicon interposer on PCB. Effect of under-fill on the solder joint reliability is demonstrated using CSAM images during temperature cycles at 250, 500, 750 and 1000 intervals. It is shown that all samples successfully passed the temperature cycle stress test.
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