用场效应管在内存中计算

D. Reis, M. Niemier, X. Hu
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引用次数: 73

摘要

处理器和内存之间的数据传输通常是提高应用程序级性能的瓶颈。内存计算(CiM),其中逻辑和算术运算在内存中执行,可以显著降低与数据传输相关的能耗和计算开销。紧凑、低功耗和快速的CiM设计最终可以提高应用程序级性能。本文介绍了一种基于铁电场效应晶体管(fefet)的CiM结构。CiM设计可以作为通用的随机存取存储器(RAM),也可以执行布尔运算((N) and, (N)OR, X(N)OR, INV)以及存储器中单词之间的加法(ADD)。与现有基于其他新兴技术的CiM设计不同,FeFET-CiM通过感测放大器中的单个电流基准实现上述操作,从而实现更紧凑的设计和更低的功耗。此外,fefet的高离子/ off比使得廉价的基于电压的传感方案成为可能。基于仿真的案例研究表明,与ReRAM和STT-RAM CiM设计相比,我们的FeFET-CiM在内存中添加32位单词时可以实现~119X (~1.6X)和~1.97X (~1.5X)的加速(和能耗降低)。此外,在广泛的基准测试中,与传统(非内存)方法相比,我们的方法提供了约2.5倍的平均加速和约1.7倍的能耗降低。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Computing in memory with FeFETs
Data transfer between a processor and memory frequently represents a bottleneck with respect to improving application-level performance. Computing in memory (CiM), where logic and arithmetic operations are performed in memory, could significantly reduce both energy consumption and computational overheads associated with data transfer. Compact, low-power, and fast CiM designs could ultimately lead to improved application-level performance. This paper introduces a CiM architecture based on ferroelectric field effect transistors (FeFETs). The CiM design can serve as a general purpose, random access memory (RAM), and can also perform Boolean operations ((N)AND, (N)OR, X(N)OR, INV) as well as addition (ADD) between words in memory. Unlike existing CiM designs based on other emerging technologies, FeFET-CiM accomplishes the aforementioned operations via a single current reference in the sense amplifier, which leads to more compact designs and lower power. Furthermore, the high Ion/Ioff ratio of FeFETs enables an inexpensive voltage-based sense scheme. Simulation-based case studies suggest that our FeFET-CiM can achieve speed-ups (and energy reduction) of ~119X (~1.6X) and ~1.97X (~1.5X) over ReRAM and STT-RAM CiM designs with respect to in-memory addition of 32-bit words. Furthermore, our approach offers an average speedup of ~2.5X and energy reduction of ~1.7X when compared to a conventional (not in-memory) approach across a wide range of benchmarks.
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